JPS5258980A - Optical measuring device for fringe patterns - Google Patents

Optical measuring device for fringe patterns

Info

Publication number
JPS5258980A
JPS5258980A JP13526975A JP13526975A JPS5258980A JP S5258980 A JPS5258980 A JP S5258980A JP 13526975 A JP13526975 A JP 13526975A JP 13526975 A JP13526975 A JP 13526975A JP S5258980 A JPS5258980 A JP S5258980A
Authority
JP
Japan
Prior art keywords
fringe patterns
measuring device
optical measuring
occurence
aggregating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13526975A
Other languages
Japanese (ja)
Inventor
Takahiko Inari
Mitsuhito Kamei
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP13526975A priority Critical patent/JPS5258980A/en
Publication of JPS5258980A publication Critical patent/JPS5258980A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Holo Graphy (AREA)

Abstract

PURPOSE:Measurement of occurence of fringe patterns is made possible by taking the interference fringes formed by an object to be examined in a television cam camera, dividing the fringes into small regions, assessing less black portions are white, aggregating these and comparing with reference values.
JP13526975A 1975-11-11 1975-11-11 Optical measuring device for fringe patterns Pending JPS5258980A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13526975A JPS5258980A (en) 1975-11-11 1975-11-11 Optical measuring device for fringe patterns

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13526975A JPS5258980A (en) 1975-11-11 1975-11-11 Optical measuring device for fringe patterns

Publications (1)

Publication Number Publication Date
JPS5258980A true JPS5258980A (en) 1977-05-14

Family

ID=15147740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13526975A Pending JPS5258980A (en) 1975-11-11 1975-11-11 Optical measuring device for fringe patterns

Country Status (1)

Country Link
JP (1) JPS5258980A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4532422A (en) * 1982-03-12 1985-07-30 Hitachi, Ltd. Electron holography microscope

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4998265A (en) * 1973-01-22 1974-09-17

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4998265A (en) * 1973-01-22 1974-09-17

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4532422A (en) * 1982-03-12 1985-07-30 Hitachi, Ltd. Electron holography microscope

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