JPS5264280A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS5264280A JPS5264280A JP13975575A JP13975575A JPS5264280A JP S5264280 A JPS5264280 A JP S5264280A JP 13975575 A JP13975575 A JP 13975575A JP 13975575 A JP13975575 A JP 13975575A JP S5264280 A JPS5264280 A JP S5264280A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- deteriorating
- measurement
- results
- display
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To display the results of measurement on a semiconductor device without deteriorating the good semiconductor device.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13975575A JPS5264280A (en) | 1975-11-22 | 1975-11-22 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13975575A JPS5264280A (en) | 1975-11-22 | 1975-11-22 | Semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5264280A true JPS5264280A (en) | 1977-05-27 |
Family
ID=15252621
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13975575A Pending JPS5264280A (en) | 1975-11-22 | 1975-11-22 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5264280A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55165648A (en) * | 1979-06-12 | 1980-12-24 | Nec Corp | Method of sorting and inspecting semiconductor device |
-
1975
- 1975-11-22 JP JP13975575A patent/JPS5264280A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55165648A (en) * | 1979-06-12 | 1980-12-24 | Nec Corp | Method of sorting and inspecting semiconductor device |
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