JPS526588A - Method of measuring electronic state of solids - Google Patents

Method of measuring electronic state of solids

Info

Publication number
JPS526588A
JPS526588A JP50081860A JP8186075A JPS526588A JP S526588 A JPS526588 A JP S526588A JP 50081860 A JP50081860 A JP 50081860A JP 8186075 A JP8186075 A JP 8186075A JP S526588 A JPS526588 A JP S526588A
Authority
JP
Japan
Prior art keywords
solids
electronic state
measuring electronic
electronic
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50081860A
Other languages
Japanese (ja)
Inventor
Akira Tonomura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP50081860A priority Critical patent/JPS526588A/en
Publication of JPS526588A publication Critical patent/JPS526588A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To measure the electronic state in solids by irradiating electromagnetic waves and charged particles on the sample and at the same time by performing an electronic spectroscopy.
JP50081860A 1975-07-04 1975-07-04 Method of measuring electronic state of solids Pending JPS526588A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50081860A JPS526588A (en) 1975-07-04 1975-07-04 Method of measuring electronic state of solids

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50081860A JPS526588A (en) 1975-07-04 1975-07-04 Method of measuring electronic state of solids

Publications (1)

Publication Number Publication Date
JPS526588A true JPS526588A (en) 1977-01-19

Family

ID=13758229

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50081860A Pending JPS526588A (en) 1975-07-04 1975-07-04 Method of measuring electronic state of solids

Country Status (1)

Country Link
JP (1) JPS526588A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60113136A (en) * 1983-11-24 1985-06-19 Shimadzu Corp X-ray photoelectron analyzer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60113136A (en) * 1983-11-24 1985-06-19 Shimadzu Corp X-ray photoelectron analyzer

Similar Documents

Publication Publication Date Title
JPS52484A (en) Method and device for test by supersonic waves
JPS51113660A (en) Method and apparatus for measuring particles
ZA764982B (en) Process for non-destructive testing by eddy currents and apparatus for carrying out such process
IL51636A0 (en) Method and apparatus for analysing the concentration of antigen or antibody by radioimmunoassay
JPS51143397A (en) Measuring process and apparatus for sample composite of unknown substances in nonndestructive state
AU521849B2 (en) Improvements in or relating to apparatus for non-destructive testing of elongated ferro-magnetic objects
DE2965570D1 (en) Method for the detection and/or determination of an antigen specific immunoglobulin, immuno-reagents to be used in said method and test kit for said determination
IT1080421B (en) APPARATUS TO SEPARATE AND MEASURE SAMPLE COMPONENT PARTS
NL7513377A (en) PROCEDURE FOR THE RADIO-IMMUNO ANALYSIS FOR THE DETERMINATION OF CARDIOTONIC GLYCOSIDE AND AN APPROPRIATE TEST SET.
ATA395075A (en) Method and apparatus for the quantitative determination of elements and substances in aqueous solutions
JPS526588A (en) Method of measuring electronic state of solids
JPS5341290A (en) Method of and apparatus for instantaneously measuring ion in carrier solution by potential
CH613043A5 (en) Method and device for measuring the concentration of specific solution components by measuring scattered light
JPS53108487A (en) Wave height measuring system
AU3527571A (en) Method and apparatus forthe electronic testing of coins
ZA717238B (en) Method and apparatus for the electronic testing of coins
GB1543970A (en) Process and apparatus for measuring the mobility of colloids in an electric field
JPS5273788A (en) Silid analyzer capable of performing somultaneous counting
JPS5322499A (en) Analysing method and appa ratus for organic acid
JPS522544A (en) Measuring device utilizing irregular signal
JPS53112675A (en) Discriminator for waveform
JPS523487A (en) Testing method and device of the bonding quality on the electric part of metal
JPS5279969A (en) Circuit for electronic watches
JPS5326166A (en) Measuring apparatus for clock time accuracy
JPS5241961A (en) Apparatus for sorting fine particles