JPS53147791U - - Google Patents

Info

Publication number
JPS53147791U
JPS53147791U JP5137577U JP5137577U JPS53147791U JP S53147791 U JPS53147791 U JP S53147791U JP 5137577 U JP5137577 U JP 5137577U JP 5137577 U JP5137577 U JP 5137577U JP S53147791 U JPS53147791 U JP S53147791U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5137577U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5137577U priority Critical patent/JPS53147791U/ja
Publication of JPS53147791U publication Critical patent/JPS53147791U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
JP5137577U 1977-04-25 1977-04-25 Pending JPS53147791U (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5137577U JPS53147791U (de) 1977-04-25 1977-04-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5137577U JPS53147791U (de) 1977-04-25 1977-04-25

Publications (1)

Publication Number Publication Date
JPS53147791U true JPS53147791U (de) 1978-11-21

Family

ID=28940611

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5137577U Pending JPS53147791U (de) 1977-04-25 1977-04-25

Country Status (1)

Country Link
JP (1) JPS53147791U (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03138850A (ja) * 1989-10-23 1991-06-13 Hitachi Ltd 2次イオン質量分析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03138850A (ja) * 1989-10-23 1991-06-13 Hitachi Ltd 2次イオン質量分析装置

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