JPS5361977A - Constant current load circuit for measuring semiconductor elementcharacteristics - Google Patents

Constant current load circuit for measuring semiconductor elementcharacteristics

Info

Publication number
JPS5361977A
JPS5361977A JP13704776A JP13704776A JPS5361977A JP S5361977 A JPS5361977 A JP S5361977A JP 13704776 A JP13704776 A JP 13704776A JP 13704776 A JP13704776 A JP 13704776A JP S5361977 A JPS5361977 A JP S5361977A
Authority
JP
Japan
Prior art keywords
load circuit
constant current
current load
elementcharacteristics
measuring semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13704776A
Other languages
Japanese (ja)
Other versions
JPS5930286B2 (en
Inventor
Hiroshi Morino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP13704776A priority Critical patent/JPS5930286B2/en
Publication of JPS5361977A publication Critical patent/JPS5361977A/en
Publication of JPS5930286B2 publication Critical patent/JPS5930286B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Continuous-Control Power Sources That Use Transistors (AREA)

Abstract

PURPOSE: To stabilize the characteristics of test elements and accurately measure the characteristics by making loading current constant in any output state of the test semiconductor element in a constant current load circuit for measuring semiconductor element characteristics.
COPYRIGHT: (C)1978,JPO&Japio
JP13704776A 1976-11-15 1976-11-15 Constant current load circuit for measuring semiconductor device characteristics Expired JPS5930286B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13704776A JPS5930286B2 (en) 1976-11-15 1976-11-15 Constant current load circuit for measuring semiconductor device characteristics

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13704776A JPS5930286B2 (en) 1976-11-15 1976-11-15 Constant current load circuit for measuring semiconductor device characteristics

Publications (2)

Publication Number Publication Date
JPS5361977A true JPS5361977A (en) 1978-06-02
JPS5930286B2 JPS5930286B2 (en) 1984-07-26

Family

ID=15189619

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13704776A Expired JPS5930286B2 (en) 1976-11-15 1976-11-15 Constant current load circuit for measuring semiconductor device characteristics

Country Status (1)

Country Link
JP (1) JPS5930286B2 (en)

Also Published As

Publication number Publication date
JPS5930286B2 (en) 1984-07-26

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