JPS537286A - Quantitative x-ray fracture analysis - Google Patents

Quantitative x-ray fracture analysis

Info

Publication number
JPS537286A
JPS537286A JP8178876A JP8178876A JPS537286A JP S537286 A JPS537286 A JP S537286A JP 8178876 A JP8178876 A JP 8178876A JP 8178876 A JP8178876 A JP 8178876A JP S537286 A JPS537286 A JP S537286A
Authority
JP
Japan
Prior art keywords
quantitative
ray
fracture analysis
ray fracture
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8178876A
Other languages
Japanese (ja)
Inventor
Masato Nagao
Sadao Nemoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8178876A priority Critical patent/JPS537286A/en
Publication of JPS537286A publication Critical patent/JPS537286A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To make it possible to accomplish the quantitative analysis simply and promptly with high accuracy by analyzing the diffraction line which is obtained by irradiating a preset portion of the fraction of a test piece with a paralled X-ray having a wide area.
JP8178876A 1976-07-08 1976-07-08 Quantitative x-ray fracture analysis Pending JPS537286A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8178876A JPS537286A (en) 1976-07-08 1976-07-08 Quantitative x-ray fracture analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8178876A JPS537286A (en) 1976-07-08 1976-07-08 Quantitative x-ray fracture analysis

Publications (1)

Publication Number Publication Date
JPS537286A true JPS537286A (en) 1978-01-23

Family

ID=13756216

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8178876A Pending JPS537286A (en) 1976-07-08 1976-07-08 Quantitative x-ray fracture analysis

Country Status (1)

Country Link
JP (1) JPS537286A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS561340A (en) * 1979-06-20 1981-01-09 Hitachi Ltd X-ray fracture analysis method
US7513982B2 (en) 2004-01-07 2009-04-07 Applied Materials, Inc. Two dimensional magnetron scanning for flat panel sputtering

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS561340A (en) * 1979-06-20 1981-01-09 Hitachi Ltd X-ray fracture analysis method
US7513982B2 (en) 2004-01-07 2009-04-07 Applied Materials, Inc. Two dimensional magnetron scanning for flat panel sputtering

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