JPS5376744A - Crystal evaluation method - Google Patents

Crystal evaluation method

Info

Publication number
JPS5376744A
JPS5376744A JP15193576A JP15193576A JPS5376744A JP S5376744 A JPS5376744 A JP S5376744A JP 15193576 A JP15193576 A JP 15193576A JP 15193576 A JP15193576 A JP 15193576A JP S5376744 A JPS5376744 A JP S5376744A
Authority
JP
Japan
Prior art keywords
evaluation method
crystal evaluation
pellet
crystal
evalutate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15193576A
Other languages
Japanese (ja)
Inventor
Shusuke Kotake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP15193576A priority Critical patent/JPS5376744A/en
Publication of JPS5376744A publication Critical patent/JPS5376744A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To evalutate the distortion of a pellet by applying a polarized ray from the mirror-surface polished pellet side face and observing the light emerging from the other side pahse through an analyzer.
COPYRIGHT: (C)1978,JPO&Japio
JP15193576A 1976-12-20 1976-12-20 Crystal evaluation method Pending JPS5376744A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15193576A JPS5376744A (en) 1976-12-20 1976-12-20 Crystal evaluation method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15193576A JPS5376744A (en) 1976-12-20 1976-12-20 Crystal evaluation method

Publications (1)

Publication Number Publication Date
JPS5376744A true JPS5376744A (en) 1978-07-07

Family

ID=15529408

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15193576A Pending JPS5376744A (en) 1976-12-20 1976-12-20 Crystal evaluation method

Country Status (1)

Country Link
JP (1) JPS5376744A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0318733A (en) * 1989-06-16 1991-01-28 Hitachi Ltd Stress monitoring method and device
JPH06148005A (en) * 1992-04-07 1994-05-27 Internatl Business Mach Corp <Ibm> Apparatus and method for optical strain mapping

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0318733A (en) * 1989-06-16 1991-01-28 Hitachi Ltd Stress monitoring method and device
JPH06148005A (en) * 1992-04-07 1994-05-27 Internatl Business Mach Corp <Ibm> Apparatus and method for optical strain mapping

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