JPS5388565A - Sample position deciding device for electronic analyzer - Google Patents

Sample position deciding device for electronic analyzer

Info

Publication number
JPS5388565A
JPS5388565A JP319977A JP319977A JPS5388565A JP S5388565 A JPS5388565 A JP S5388565A JP 319977 A JP319977 A JP 319977A JP 319977 A JP319977 A JP 319977A JP S5388565 A JPS5388565 A JP S5388565A
Authority
JP
Japan
Prior art keywords
sample position
deciding device
position deciding
electronic analyzer
analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP319977A
Other languages
Japanese (ja)
Other versions
JPS6158774B2 (en
Inventor
Hiroyoshi Soejima
Tadahiro Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Shimadzu Corp
Original Assignee
Shimadzu Corp
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Kawasaki Steel Corp filed Critical Shimadzu Corp
Priority to JP319977A priority Critical patent/JPS5388565A/en
Publication of JPS5388565A publication Critical patent/JPS5388565A/en
Publication of JPS6158774B2 publication Critical patent/JPS6158774B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To secure a control for the sample tremor device in an analyzer by delivering the stage shift amount in each direction of the tremor device in the form of data.
JP319977A 1977-01-14 1977-01-14 Sample position deciding device for electronic analyzer Granted JPS5388565A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP319977A JPS5388565A (en) 1977-01-14 1977-01-14 Sample position deciding device for electronic analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP319977A JPS5388565A (en) 1977-01-14 1977-01-14 Sample position deciding device for electronic analyzer

Publications (2)

Publication Number Publication Date
JPS5388565A true JPS5388565A (en) 1978-08-04
JPS6158774B2 JPS6158774B2 (en) 1986-12-13

Family

ID=11550743

Family Applications (1)

Application Number Title Priority Date Filing Date
JP319977A Granted JPS5388565A (en) 1977-01-14 1977-01-14 Sample position deciding device for electronic analyzer

Country Status (1)

Country Link
JP (1) JPS5388565A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58112341A (en) * 1981-12-26 1983-07-04 Fujitsu Ltd Analyzing unit for integrated circuit

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3928014B2 (en) * 2004-01-23 2007-06-13 理学電機工業株式会社 X-ray fluorescence analyzer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5162783A (en) * 1974-11-29 1976-05-31 Kogyo Gijutsuin

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5162783A (en) * 1974-11-29 1976-05-31 Kogyo Gijutsuin

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58112341A (en) * 1981-12-26 1983-07-04 Fujitsu Ltd Analyzing unit for integrated circuit

Also Published As

Publication number Publication date
JPS6158774B2 (en) 1986-12-13

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