JPS54108567A - Electron microscope - Google Patents

Electron microscope

Info

Publication number
JPS54108567A
JPS54108567A JP1303278A JP1303278A JPS54108567A JP S54108567 A JPS54108567 A JP S54108567A JP 1303278 A JP1303278 A JP 1303278A JP 1303278 A JP1303278 A JP 1303278A JP S54108567 A JPS54108567 A JP S54108567A
Authority
JP
Japan
Prior art keywords
electron microscope
microscope
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1303278A
Other languages
English (en)
Japanese (ja)
Inventor
Buetsuiku Kurausu
Eruraa Eberuharuto
Eederuman Yohanesu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AKADEMII BUITSUSEN SHIYAFUTEND
Original Assignee
AKADEMII BUITSUSEN SHIYAFUTEND
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AKADEMII BUITSUSEN SHIYAFUTEND filed Critical AKADEMII BUITSUSEN SHIYAFUTEND
Publication of JPS54108567A publication Critical patent/JPS54108567A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
    • G01N3/18—Performing tests at high or low temperatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/38—Concrete; Lime; Mortar; Gypsum; Bricks; Ceramics; Glass
    • G01N33/388—Ceramics

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
JP1303278A 1977-02-11 1978-02-09 Electron microscope Pending JPS54108567A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD19733077A DD129507A1 (de) 1977-02-11 1977-02-11 Vorrichtung zur zugverformung und erwaermung von proben

Publications (1)

Publication Number Publication Date
JPS54108567A true JPS54108567A (en) 1979-08-25

Family

ID=5507340

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1303278A Pending JPS54108567A (en) 1977-02-11 1978-02-09 Electron microscope

Country Status (4)

Country Link
JP (1) JPS54108567A (de)
DD (1) DD129507A1 (de)
DE (1) DE2753700A1 (de)
NL (1) NL7713974A (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19729526C2 (de) * 1997-07-10 1999-07-22 Frank Siegelin Beheizbarer Probentisch zur in-situ Abbildung in Rasterelektronenmikroskopen bei hihen Temperaturen

Also Published As

Publication number Publication date
NL7713974A (nl) 1978-08-15
DD129507A1 (de) 1978-01-18
DE2753700A1 (de) 1978-08-17

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