JPS5425775A - Easy measuring method of dielectric characteristics - Google Patents

Easy measuring method of dielectric characteristics

Info

Publication number
JPS5425775A
JPS5425775A JP9033477A JP9033477A JPS5425775A JP S5425775 A JPS5425775 A JP S5425775A JP 9033477 A JP9033477 A JP 9033477A JP 9033477 A JP9033477 A JP 9033477A JP S5425775 A JPS5425775 A JP S5425775A
Authority
JP
Japan
Prior art keywords
measuring method
dielectric characteristics
easy measuring
forming
easy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9033477A
Other languages
Japanese (ja)
Inventor
Hirosuke Kurihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9033477A priority Critical patent/JPS5425775A/en
Publication of JPS5425775A publication Critical patent/JPS5425775A/en
Pending legal-status Critical Current

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  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE: To make the measurement of capacity value easy and rapid by forming an upper electrode readily through acidic liquid in the sample having undergone anodic oxidation thereby forming a capacity element.
COPYRIGHT: (C)1979,JPO&Japio
JP9033477A 1977-07-29 1977-07-29 Easy measuring method of dielectric characteristics Pending JPS5425775A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9033477A JPS5425775A (en) 1977-07-29 1977-07-29 Easy measuring method of dielectric characteristics

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9033477A JPS5425775A (en) 1977-07-29 1977-07-29 Easy measuring method of dielectric characteristics

Publications (1)

Publication Number Publication Date
JPS5425775A true JPS5425775A (en) 1979-02-26

Family

ID=13995610

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9033477A Pending JPS5425775A (en) 1977-07-29 1977-07-29 Easy measuring method of dielectric characteristics

Country Status (1)

Country Link
JP (1) JPS5425775A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04121668A (en) * 1990-09-12 1992-04-22 Mitsubishi Electric Corp Method for measuring capacitance of mim type capacitor
CN102981060A (en) * 2012-09-07 2013-03-20 清华大学 Graphene quantum capacity measurement device and preparing method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04121668A (en) * 1990-09-12 1992-04-22 Mitsubishi Electric Corp Method for measuring capacitance of mim type capacitor
CN102981060A (en) * 2012-09-07 2013-03-20 清华大学 Graphene quantum capacity measurement device and preparing method thereof

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