JPS5445543A - Test method for magnetic bubble memory unit - Google Patents

Test method for magnetic bubble memory unit

Info

Publication number
JPS5445543A
JPS5445543A JP11237477A JP11237477A JPS5445543A JP S5445543 A JPS5445543 A JP S5445543A JP 11237477 A JP11237477 A JP 11237477A JP 11237477 A JP11237477 A JP 11237477A JP S5445543 A JPS5445543 A JP S5445543A
Authority
JP
Japan
Prior art keywords
minor loop
magnetic field
malfunction
written
bias magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11237477A
Other languages
Japanese (ja)
Other versions
JPS5931151B2 (en
Inventor
Nakahiko Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP52112374A priority Critical patent/JPS5931151B2/en
Publication of JPS5445543A publication Critical patent/JPS5445543A/en
Publication of JPS5931151B2 publication Critical patent/JPS5931151B2/en
Expired legal-status Critical Current

Links

Abstract

PURPOSE: To enable to quick and sure test, by writing in the magnetic bubble for the minor loop having the bias magnetic field margin lower limit value more than given permission and by increasing the frequency of occurrence of misoperation of magnetic bubbles.
CONSTITUTION: When the bias magnetic field is made lower than conventional set value, "O" is wirtten in the minor loop of 234 and when arbitrary information pattern is written in other minor loop, malfunction is taken place in the rate of once at average 10 hours. Accordingly, by keeping the bias magnetic field as 940e and the rotating magnetic field as 450e, the minor loop of 234 is written in the arbitrary pattern including "O" and "1", "O" is written in other minor loop, and the frequency of occurrence for malfunction can be increased similarly by observing the "O" information of the minor loop other than the minor loop 234, and the detection of malfunction can accurately be made in a short time
COPYRIGHT: (C)1979,JPO&Japio
JP52112374A 1977-09-19 1977-09-19 Test method for magnetic bubble storage device Expired JPS5931151B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52112374A JPS5931151B2 (en) 1977-09-19 1977-09-19 Test method for magnetic bubble storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52112374A JPS5931151B2 (en) 1977-09-19 1977-09-19 Test method for magnetic bubble storage device

Publications (2)

Publication Number Publication Date
JPS5445543A true JPS5445543A (en) 1979-04-10
JPS5931151B2 JPS5931151B2 (en) 1984-07-31

Family

ID=14585078

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52112374A Expired JPS5931151B2 (en) 1977-09-19 1977-09-19 Test method for magnetic bubble storage device

Country Status (1)

Country Link
JP (1) JPS5931151B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59180880A (en) * 1983-03-31 1984-10-15 Fujitsu Ltd Test method of magnetic bubble memory element

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51137337A (en) * 1975-05-23 1976-11-27 Hitachi Ltd Testing system for a magnetic bubble chip
JPS51139737A (en) * 1975-05-29 1976-12-02 Fujitsu Ltd Measuring method for magnetic bubble devices
JPS51140529A (en) * 1975-05-30 1976-12-03 Hitachi Ltd Test method of magnetic bubble memory element and it's test equipment
JPS526035A (en) * 1975-06-30 1977-01-18 Ibm Method of testing magnetic bubble domain chip

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51137337A (en) * 1975-05-23 1976-11-27 Hitachi Ltd Testing system for a magnetic bubble chip
JPS51139737A (en) * 1975-05-29 1976-12-02 Fujitsu Ltd Measuring method for magnetic bubble devices
JPS51140529A (en) * 1975-05-30 1976-12-03 Hitachi Ltd Test method of magnetic bubble memory element and it's test equipment
JPS526035A (en) * 1975-06-30 1977-01-18 Ibm Method of testing magnetic bubble domain chip

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59180880A (en) * 1983-03-31 1984-10-15 Fujitsu Ltd Test method of magnetic bubble memory element

Also Published As

Publication number Publication date
JPS5931151B2 (en) 1984-07-31

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