JPS5468286A - Metal surface flaw detecting device - Google Patents

Metal surface flaw detecting device

Info

Publication number
JPS5468286A
JPS5468286A JP13551177A JP13551177A JPS5468286A JP S5468286 A JPS5468286 A JP S5468286A JP 13551177 A JP13551177 A JP 13551177A JP 13551177 A JP13551177 A JP 13551177A JP S5468286 A JPS5468286 A JP S5468286A
Authority
JP
Japan
Prior art keywords
circuit
binary
metal surface
signal
reflected light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13551177A
Other languages
Japanese (ja)
Inventor
Terubumi Honjo
Hiromichi Fukuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP13551177A priority Critical patent/JPS5468286A/en
Publication of JPS5468286A publication Critical patent/JPS5468286A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To detect flaw on metal surface of which light reflectance is not stable at high accuracy, by enabling to stably separate the metal surface reflected light and flaw reflected light. CONSTITUTION:When the reflected light from the metal surface is imaged on the light receiving plane, photoelectric conversion signal from each coordinate point of the pattern being read is outputted, and this video signal is inputted into a binary circuit 303 and a slice voltage generating circuit 304. In this circuit 304, the reflection signal group obtained by two-dimensional scanning is selected, and the quantity of reflected light from an arbitrary small area in the part to be read is detected, and a correction signal to correct the binary slice voltage of the binary circuit is generated. The binary circuit, according to this correction signal, converts the inputted video signal into a binary signal. Thus quantized video signal groups are stored in a register 307 as two-dimensional pattern information. next, in a distinguishing circuit, the two-dimensional pattern information inputted in the register is examined in each coordinate point to see whether the information agrees with the feature pattern condition to be classified as a flaw with respect to each coordinate point, and the resuet of flow detection is outputted.
JP13551177A 1977-11-10 1977-11-10 Metal surface flaw detecting device Pending JPS5468286A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13551177A JPS5468286A (en) 1977-11-10 1977-11-10 Metal surface flaw detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13551177A JPS5468286A (en) 1977-11-10 1977-11-10 Metal surface flaw detecting device

Publications (1)

Publication Number Publication Date
JPS5468286A true JPS5468286A (en) 1979-06-01

Family

ID=15153462

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13551177A Pending JPS5468286A (en) 1977-11-10 1977-11-10 Metal surface flaw detecting device

Country Status (1)

Country Link
JP (1) JPS5468286A (en)

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