JPS5477569A - Production of semiconductor element - Google Patents
Production of semiconductor elementInfo
- Publication number
- JPS5477569A JPS5477569A JP14526277A JP14526277A JPS5477569A JP S5477569 A JPS5477569 A JP S5477569A JP 14526277 A JP14526277 A JP 14526277A JP 14526277 A JP14526277 A JP 14526277A JP S5477569 A JPS5477569 A JP S5477569A
- Authority
- JP
- Japan
- Prior art keywords
- film
- windows
- resist
- serration
- electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/019—Manufacture or treatment of bond pads
Landscapes
- Weting (AREA)
- Wire Bonding (AREA)
Abstract
PURPOSE: To eliminate adverse influence on electrode window formation through serration of film thickness and make fine windows by forming a Si3N4 film only on bonding pad parts and well bonding electrode metals and semiconductor substrate.
CONSTITUTION: After a base layer 1 is provided on a Si substrate 4, SiO2 2, Si3N4 3 are superposed and resist is provided on the parts intended for connection of lead-out electrodes and external electrodes, through the former of which the film 3 is selectively etched. Next, when the resist film 5' is opened (a), the serration based on the thickness of the film 3 is suffciently a way from the pening (a) and the resist is formed flat and therefore light scattering is small at the time of exposure and fine holes are formed. Next, windows are opened in the film 2 through the resist mask and an emitter layer 10 is created. Next, base electrode windows are formed and multilayer electrodes of Ti 12-Pt 13-Au 14 are made by way of platinum silicide 11. According to this method, the bonding strength is equivalent to that by ordinary methods and the finer emitter windows may be formed.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14526277A JPS5477569A (en) | 1977-12-02 | 1977-12-02 | Production of semiconductor element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14526277A JPS5477569A (en) | 1977-12-02 | 1977-12-02 | Production of semiconductor element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5477569A true JPS5477569A (en) | 1979-06-21 |
| JPS6212663B2 JPS6212663B2 (en) | 1987-03-19 |
Family
ID=15381054
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14526277A Granted JPS5477569A (en) | 1977-12-02 | 1977-12-02 | Production of semiconductor element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5477569A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6260249A (en) * | 1985-09-09 | 1987-03-16 | Nec Corp | Semiconductor device |
-
1977
- 1977-12-02 JP JP14526277A patent/JPS5477569A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6260249A (en) * | 1985-09-09 | 1987-03-16 | Nec Corp | Semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6212663B2 (en) | 1987-03-19 |
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