JPS5484794A - Xxray spectroscope - Google Patents

Xxray spectroscope

Info

Publication number
JPS5484794A
JPS5484794A JP15269177A JP15269177A JPS5484794A JP S5484794 A JPS5484794 A JP S5484794A JP 15269177 A JP15269177 A JP 15269177A JP 15269177 A JP15269177 A JP 15269177A JP S5484794 A JPS5484794 A JP S5484794A
Authority
JP
Japan
Prior art keywords
crystal
plates
gear
phi
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15269177A
Other languages
Japanese (ja)
Other versions
JPS6215822B2 (en
Inventor
Shojiro Tagata
Ichiro Ando
Kazuyasu Kawabe
Masaki Saito
Toshiaki Miyokawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP15269177A priority Critical patent/JPS5484794A/en
Publication of JPS5484794A publication Critical patent/JPS5484794A/en
Publication of JPS6215822B2 publication Critical patent/JPS6215822B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To enable SN ratio to be improved without decreasing signal intensity of X-rays and wavelength resolution over the measurement of the entire wavelength by changing opening angles PSI and phi mutually in opposite directions according to position changes of spectral crystal. CONSTITUTION:In the X-ray spectroscope wherein an X-ray source, spectral crystal 3 and detector are on the Rowland circumference, the crystal 3 is linearly moved by a driving bar 5, by which the Bragg angle of the incident X-rays is changed. At the same time, the revolving shaft 15 which penetrates through a guide body 10 is revolved by way of a gear 18, intermediate gear 17 and gear 16. The L-type crossarms 12a thru 12d fiued to shafts 11a, 11b, 13a, 13d are turned by the cam 14 fixed to the shaft 15. This causes slit plates 7a, 7b to be moved along guide plates 8a, 8b and at the same time slit plates 9a, 9b to be moved parallel in the direction orthogonal to the plates 7a, 7b along the guide body 10. This also causes slit widths to be changed mutually oppositely. Hence, the optimum opening angles PSI, phi are obtainable according to the position changes of the crystal 3.
JP15269177A 1977-12-19 1977-12-19 Xxray spectroscope Granted JPS5484794A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15269177A JPS5484794A (en) 1977-12-19 1977-12-19 Xxray spectroscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15269177A JPS5484794A (en) 1977-12-19 1977-12-19 Xxray spectroscope

Publications (2)

Publication Number Publication Date
JPS5484794A true JPS5484794A (en) 1979-07-05
JPS6215822B2 JPS6215822B2 (en) 1987-04-09

Family

ID=15546016

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15269177A Granted JPS5484794A (en) 1977-12-19 1977-12-19 Xxray spectroscope

Country Status (1)

Country Link
JP (1) JPS5484794A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6175244A (en) * 1984-09-20 1986-04-17 Jeol Ltd X-ray spectrometer
JPH0259459U (en) * 1988-10-24 1990-05-01
JP2007093581A (en) * 2005-09-01 2007-04-12 Jeol Ltd Wavelength dispersive X-ray spectrometer
JP2022085853A (en) * 2020-11-27 2022-06-08 日本電子株式会社 X-ray detector and method
US11699567B2 (en) 2020-11-27 2023-07-11 Jeol Ltd. X-ray detection apparatus and method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6175244A (en) * 1984-09-20 1986-04-17 Jeol Ltd X-ray spectrometer
JPH0259459U (en) * 1988-10-24 1990-05-01
JP2007093581A (en) * 2005-09-01 2007-04-12 Jeol Ltd Wavelength dispersive X-ray spectrometer
JP2022085853A (en) * 2020-11-27 2022-06-08 日本電子株式会社 X-ray detector and method
US11699567B2 (en) 2020-11-27 2023-07-11 Jeol Ltd. X-ray detection apparatus and method

Also Published As

Publication number Publication date
JPS6215822B2 (en) 1987-04-09

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