JPS55109902A - Oblique image pickup correction system of subject size measuring instrument - Google Patents

Oblique image pickup correction system of subject size measuring instrument

Info

Publication number
JPS55109902A
JPS55109902A JP1600779A JP1600779A JPS55109902A JP S55109902 A JPS55109902 A JP S55109902A JP 1600779 A JP1600779 A JP 1600779A JP 1600779 A JP1600779 A JP 1600779A JP S55109902 A JPS55109902 A JP S55109902A
Authority
JP
Japan
Prior art keywords
subject
screen
bright lines
measuring instrument
displaying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1600779A
Other languages
Japanese (ja)
Other versions
JPS6125081B2 (en
Inventor
Koji Fujita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kokusai Denki Electric Inc
Original Assignee
Hitachi Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Denshi KK filed Critical Hitachi Denshi KK
Priority to JP1600779A priority Critical patent/JPS55109902A/en
Publication of JPS55109902A publication Critical patent/JPS55109902A/en
Publication of JPS6125081B2 publication Critical patent/JPS6125081B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Inking, Control Or Cleaning Of Printing Machines (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE: To take an accurate size measurement of a subject by displaying cursors on a screen while displaying the image of the subject on the screen for video monitor, and then by measuring the size by making cursors agree with fixed positions of the subject image.
CONSTITUTION: Subject 4 is picked up by television camera 1, whose video signal output is processed by camera controller 5 and then sent to video monitor display unit 7 by way of size measuring instrument 6 to obtain subject image 9 on screen 8, but bright lines 31A and 31B showing sampling positions appear on screen 8 of display unit 7 at the same time. Here, rotation controller 32 is provided which has a function of generating and supplying bright-line signals displaying bright lines 31A and 31B to camera controller 5 and switch SW for setting an interval between bright lines 31A and 31B, and those bright lines 31A and 31B are made to agree with fixed positions of the subject image, so that a size measurement of the subject can accurately be taken.
COPYRIGHT: (C)1980,JPO&Japio
JP1600779A 1979-02-16 1979-02-16 Oblique image pickup correction system of subject size measuring instrument Granted JPS55109902A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1600779A JPS55109902A (en) 1979-02-16 1979-02-16 Oblique image pickup correction system of subject size measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1600779A JPS55109902A (en) 1979-02-16 1979-02-16 Oblique image pickup correction system of subject size measuring instrument

Publications (2)

Publication Number Publication Date
JPS55109902A true JPS55109902A (en) 1980-08-23
JPS6125081B2 JPS6125081B2 (en) 1986-06-13

Family

ID=11904534

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1600779A Granted JPS55109902A (en) 1979-02-16 1979-02-16 Oblique image pickup correction system of subject size measuring instrument

Country Status (1)

Country Link
JP (1) JPS55109902A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61116606A (en) * 1984-11-12 1986-06-04 Hitachi Ltd Length measuring device
WO1994024518A1 (en) * 1993-04-21 1994-10-27 Omron Corporation Visual inspection support apparatus, substrate inspection apparatus, and soldering inspection and correction methods using the same apparatuses
KR100324182B1 (en) * 1999-11-03 2002-02-16 김윤수 A method and device of reflex measurement

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61116606A (en) * 1984-11-12 1986-06-04 Hitachi Ltd Length measuring device
WO1994024518A1 (en) * 1993-04-21 1994-10-27 Omron Corporation Visual inspection support apparatus, substrate inspection apparatus, and soldering inspection and correction methods using the same apparatuses
US6362877B1 (en) 1993-04-21 2002-03-26 Omron Corporation Visual inspection supporting apparatus and printed circuit board inspecting apparatus, and methods of soldering inspection and correction using the apparatuses
KR100324182B1 (en) * 1999-11-03 2002-02-16 김윤수 A method and device of reflex measurement

Also Published As

Publication number Publication date
JPS6125081B2 (en) 1986-06-13

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