JPS55116203U - - Google Patents
Info
- Publication number
- JPS55116203U JPS55116203U JP1605079U JP1605079U JPS55116203U JP S55116203 U JPS55116203 U JP S55116203U JP 1605079 U JP1605079 U JP 1605079U JP 1605079 U JP1605079 U JP 1605079U JP S55116203 U JPS55116203 U JP S55116203U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Drawing Aids And Blackboards (AREA)
- Length-Measuring Instruments Using Mechanical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1605079U JPS55116203U (de) | 1979-02-09 | 1979-02-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1605079U JPS55116203U (de) | 1979-02-09 | 1979-02-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS55116203U true JPS55116203U (de) | 1980-08-16 |
Family
ID=28838856
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1605079U Pending JPS55116203U (de) | 1979-02-09 | 1979-02-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55116203U (de) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5230167A (en) * | 1975-09-03 | 1977-03-07 | Hitachi Ltd | Method for production of semiconductor device |
| JPS5268377A (en) * | 1975-12-05 | 1977-06-07 | Toshiba Corp | Characteristics measurement for semiconductor element |
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1979
- 1979-02-09 JP JP1605079U patent/JPS55116203U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5230167A (en) * | 1975-09-03 | 1977-03-07 | Hitachi Ltd | Method for production of semiconductor device |
| JPS5268377A (en) * | 1975-12-05 | 1977-06-07 | Toshiba Corp | Characteristics measurement for semiconductor element |