JPS5521189A - Storing tray for measuring of semiconductor chip - Google Patents

Storing tray for measuring of semiconductor chip

Info

Publication number
JPS5521189A
JPS5521189A JP9524378A JP9524378A JPS5521189A JP S5521189 A JPS5521189 A JP S5521189A JP 9524378 A JP9524378 A JP 9524378A JP 9524378 A JP9524378 A JP 9524378A JP S5521189 A JPS5521189 A JP S5521189A
Authority
JP
Japan
Prior art keywords
storing
semiconductor chips
electromagnet
measuring
tray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9524378A
Other languages
Japanese (ja)
Inventor
Takashi Ono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP9524378A priority Critical patent/JPS5521189A/en
Publication of JPS5521189A publication Critical patent/JPS5521189A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To promte speeding up of measuring work by arranging the gate part of chip always in a fixed direction by means of a magnet when storing semiconductor chips in the storing tray pockets.
CONSTITUTION: To form a cathode electrode 5 and a gate electrode 6 on the surface and an anode electrode 11 on the back. To provide a semiconductor chip 201 with a laminar magnetic substance 8 soldered on the gate electrode 6 in the surface corner part as well as a laminar tray 200 having a burried electromagnet 11 at the storing pocket 9 to store the said chips. Having stored semiconductor chips in the storing pockets, the electromagnet will be excited. With the attraction force of the magnetic substance 8 and the electromagnet 11, the semiconductor chips stored in the storing pocket will be so arranged that the gate part will be positioned close to the corner part. Since the present device enables it to make sure the storing position and the orientation it makes possible to fairly enlarge the storing pocket size and also to make the semiconductor chips storing work easier thus speeding up the measuring work.
COPYRIGHT: (C)1980,JPO&Japio
JP9524378A 1978-08-03 1978-08-03 Storing tray for measuring of semiconductor chip Pending JPS5521189A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9524378A JPS5521189A (en) 1978-08-03 1978-08-03 Storing tray for measuring of semiconductor chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9524378A JPS5521189A (en) 1978-08-03 1978-08-03 Storing tray for measuring of semiconductor chip

Publications (1)

Publication Number Publication Date
JPS5521189A true JPS5521189A (en) 1980-02-15

Family

ID=14132302

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9524378A Pending JPS5521189A (en) 1978-08-03 1978-08-03 Storing tray for measuring of semiconductor chip

Country Status (1)

Country Link
JP (1) JPS5521189A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63151038A (en) * 1986-12-16 1988-06-23 Tokyo Electron Ltd Method of feeding and inspecting package having different configuration

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63151038A (en) * 1986-12-16 1988-06-23 Tokyo Electron Ltd Method of feeding and inspecting package having different configuration

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