JPS5536722A - Instrument for measuring ratio of component in composite material - Google Patents

Instrument for measuring ratio of component in composite material

Info

Publication number
JPS5536722A
JPS5536722A JP10916478A JP10916478A JPS5536722A JP S5536722 A JPS5536722 A JP S5536722A JP 10916478 A JP10916478 A JP 10916478A JP 10916478 A JP10916478 A JP 10916478A JP S5536722 A JPS5536722 A JP S5536722A
Authority
JP
Japan
Prior art keywords
electrodes
composite material
ratio
instrument
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10916478A
Other languages
Japanese (ja)
Inventor
Atsushi Maruyama
Akio Aoki
Hiroyuki Unishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Engineering Corp
Original Assignee
NKK Corp
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NKK Corp, Nippon Kokan Ltd filed Critical NKK Corp
Priority to JP10916478A priority Critical patent/JPS5536722A/en
Publication of JPS5536722A publication Critical patent/JPS5536722A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

PURPOSE: To accurately measure the ratio of components in composite material by arranging a plurality of positive and negative electrodes on substantially equal plane and guard electrodes for preventing electric line of force leaked except for facing electrodes at essential parts.
CONSTITUTION: Positive and negative electrodes 6 and 7 are alternatively arranged on a plane of measuring electrodes, and guard electrodes 8 are arranged around the electrodes 6 and 7. Guard electrodes 9 are also arranged on the top surface of the measuring electrodes and grounded to shut off external noise. The ratio of components in the composite material is measured by making the probe contact with the surface of testpiece.
COPYRIGHT: (C)1980,JPO&Japio
JP10916478A 1978-09-07 1978-09-07 Instrument for measuring ratio of component in composite material Pending JPS5536722A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10916478A JPS5536722A (en) 1978-09-07 1978-09-07 Instrument for measuring ratio of component in composite material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10916478A JPS5536722A (en) 1978-09-07 1978-09-07 Instrument for measuring ratio of component in composite material

Publications (1)

Publication Number Publication Date
JPS5536722A true JPS5536722A (en) 1980-03-14

Family

ID=14503265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10916478A Pending JPS5536722A (en) 1978-09-07 1978-09-07 Instrument for measuring ratio of component in composite material

Country Status (1)

Country Link
JP (1) JPS5536722A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4551674A (en) * 1982-11-12 1985-11-05 At&T Bell Laboratories Noncontacting conductivity type determination and surface state spectroscopy of semiconductor materials
JPS627062U (en) * 1985-06-29 1987-01-16
WO2000014522A1 (en) * 1998-09-02 2000-03-16 Mayekawa Mfg. Co., Ltd. Noncontact article temperature measuring device for food
JP2007183292A (en) * 2007-03-30 2007-07-19 Shinshu Univ Compounding ratio identification method for composite materials
JP2008032550A (en) * 2006-07-28 2008-02-14 T & D:Kk Capacitance type detection device
JP2008070117A (en) * 2006-09-12 2008-03-27 Terada Seisakusho Co Ltd Moisture content measuring device using electrical impedance and capacitance
JP2019523868A (en) * 2016-06-03 2019-08-29 ブランデンバーグ （ユーケイ） リミテッド Object detection

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3515987A (en) * 1967-10-20 1970-06-02 Avco Corp Coplanar dielectric probe having means for minimizing capacitance from stray sources

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3515987A (en) * 1967-10-20 1970-06-02 Avco Corp Coplanar dielectric probe having means for minimizing capacitance from stray sources

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4551674A (en) * 1982-11-12 1985-11-05 At&T Bell Laboratories Noncontacting conductivity type determination and surface state spectroscopy of semiconductor materials
JPS627062U (en) * 1985-06-29 1987-01-16
WO2000014522A1 (en) * 1998-09-02 2000-03-16 Mayekawa Mfg. Co., Ltd. Noncontact article temperature measuring device for food
JP2008032550A (en) * 2006-07-28 2008-02-14 T & D:Kk Capacitance type detection device
JP2008070117A (en) * 2006-09-12 2008-03-27 Terada Seisakusho Co Ltd Moisture content measuring device using electrical impedance and capacitance
JP2007183292A (en) * 2007-03-30 2007-07-19 Shinshu Univ Compounding ratio identification method for composite materials
JP2019523868A (en) * 2016-06-03 2019-08-29 ブランデンバーグ （ユーケイ） リミテッド Object detection
JP2022071167A (en) * 2016-06-03 2022-05-13 ブランデンバーグ （ユーケイ） リミテッド Sensing of objects
JP2024028768A (en) * 2016-06-03 2024-03-05 コーカス・リミテッド Object detection

Similar Documents

Publication Publication Date Title
JPS5536722A (en) Instrument for measuring ratio of component in composite material
JPS5249055A (en) Method of measuring surface roughness
JPS53129637A (en) Mask for photoetching
JPS5244673A (en) Loss angle measuring instrument
JPS5322477A (en) Measuring jig
JPS5233585A (en) Device for controlling contact pressure of probe for ultrasonic flaw de tectors
JPS5560804A (en) Measuring method for film thickness
JPS52151040A (en) Raw material layer thickness detecting apparatus
JPS5230474A (en) Apparatus for measuring power line current
JPS5228872A (en) Method for measuring the size of thin plane
JPS52155065A (en) Wafer insepaction method
JPS5229777A (en) Small-size measuring instrument
JPS52129457A (en) In-process measuring apparatus for surface damages of gear teeth
JPS5537943A (en) Capacity type displacement measurement device
JPS566170A (en) Iron loss measuring instrument
JPS56125646A (en) Fissure size detecting method
JPS5322476A (en) Measuring jig
JPS5412840A (en) Measuring method for surface potential of electrophotographic photoreceptor by time series
JPS55114904A (en) Internal hole thickness measuring method
JPS5439678A (en) Thermomechanical meterial testing apparatus
JPS5364540A (en) Optical dimension detector
JPS54135584A (en) Electrostatic capacity type measuring apparatus
JPS5599063A (en) Measuring apparatus for oxygen concentration
JPS53138365A (en) Gap measuring device
JPS5310493A (en) Measurement of permeability of original paper