JPS5537902A - Abnormal condition monitoring method and apparatus of measurement system - Google Patents
Abnormal condition monitoring method and apparatus of measurement systemInfo
- Publication number
- JPS5537902A JPS5537902A JP11021878A JP11021878A JPS5537902A JP S5537902 A JPS5537902 A JP S5537902A JP 11021878 A JP11021878 A JP 11021878A JP 11021878 A JP11021878 A JP 11021878A JP S5537902 A JPS5537902 A JP S5537902A
- Authority
- JP
- Japan
- Prior art keywords
- master
- measurement system
- abnormal condition
- case
- observation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 title abstract 7
- 230000002159 abnormal effect Effects 0.000 title abstract 3
- 238000000034 method Methods 0.000 title 1
- 238000012544 monitoring process Methods 0.000 title 1
- 230000005856 abnormality Effects 0.000 abstract 1
- 238000004513 sizing Methods 0.000 abstract 1
Landscapes
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
PURPOSE: To judge whether the measurement system is in a abnormal condition or normal condition by master checking immediately at the time when the abrupt change in amount of gradual change of the dimension observation.
CONSTITUTION: In the measurement system such as automatic sizing device or dimension selecting device having a function for carrying out the master check periodically at a set interval by means of a setter and having a master 4 for the correction of gauge, in the case of abruptly changing the change amount of the gradual change of the observation of dimension determined by the measurement system, the master check is carried out immediately, and the abnormal condition or the normal condition is judged in accordance whether the observation value of that master deviates from the predetermined error range or not. The measurement signal of the gauge 3 is fed to the correction operating circuit 11 in the case of the work to be determined being the work piece W, and transmitted to the master measurement value memory circuit 14 and the measurement system abnormality judging circuit 12 in the case it being the master check.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11021878A JPS5537902A (en) | 1978-09-09 | 1978-09-09 | Abnormal condition monitoring method and apparatus of measurement system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11021878A JPS5537902A (en) | 1978-09-09 | 1978-09-09 | Abnormal condition monitoring method and apparatus of measurement system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5537902A true JPS5537902A (en) | 1980-03-17 |
Family
ID=14530060
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11021878A Pending JPS5537902A (en) | 1978-09-09 | 1978-09-09 | Abnormal condition monitoring method and apparatus of measurement system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5537902A (en) |
-
1978
- 1978-09-09 JP JP11021878A patent/JPS5537902A/en active Pending
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