JPS5546182A - Flaw signal generation unit for adjustment for eddy current flaw detector - Google Patents

Flaw signal generation unit for adjustment for eddy current flaw detector

Info

Publication number
JPS5546182A
JPS5546182A JP12060178A JP12060178A JPS5546182A JP S5546182 A JPS5546182 A JP S5546182A JP 12060178 A JP12060178 A JP 12060178A JP 12060178 A JP12060178 A JP 12060178A JP S5546182 A JPS5546182 A JP S5546182A
Authority
JP
Japan
Prior art keywords
flaw
eddy current
detector
data
adjustment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12060178A
Other languages
Japanese (ja)
Other versions
JPS615619B2 (en
Inventor
Takashi Okamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP12060178A priority Critical patent/JPS5546182A/en
Publication of JPS5546182A publication Critical patent/JPS5546182A/en
Publication of JPS615619B2 publication Critical patent/JPS615619B2/ja
Granted legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE: To simply perform the adjustment and setting work for each part based on test piece in a short time, by using the data related to the standard flaw formed artificially to flaw detecting repetitively.
CONSTITUTION: The test piece 15 having the standard flaw A and the flaw B greater than it artificially is found for the flaw with the detector 1 of eddy current flaw detector, and the balance output based on the detected output is sequentially in A/D conversion 8 and stored 9. In this memory, the oldest data is thrown away and the new data is sequentially taken. Further, the renewal of the stored data is stopped with the detection of the flaw B when the data of the flaw A is stored, the output of the memory is in D/A conversion 10, and it is repetitively outputted for the adjusting flaw signal of the eddy current flaw detector.
COPYRIGHT: (C)1980,JPO&Japio
JP12060178A 1978-09-29 1978-09-29 Flaw signal generation unit for adjustment for eddy current flaw detector Granted JPS5546182A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12060178A JPS5546182A (en) 1978-09-29 1978-09-29 Flaw signal generation unit for adjustment for eddy current flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12060178A JPS5546182A (en) 1978-09-29 1978-09-29 Flaw signal generation unit for adjustment for eddy current flaw detector

Publications (2)

Publication Number Publication Date
JPS5546182A true JPS5546182A (en) 1980-03-31
JPS615619B2 JPS615619B2 (en) 1986-02-20

Family

ID=14790286

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12060178A Granted JPS5546182A (en) 1978-09-29 1978-09-29 Flaw signal generation unit for adjustment for eddy current flaw detector

Country Status (1)

Country Link
JP (1) JPS5546182A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59108956A (en) * 1982-12-14 1984-06-23 Nippon Steel Corp Output voltage correction for multiprobe eddy current type flaw detector
JPS62121346A (en) * 1985-11-21 1987-06-02 Kobe Steel Ltd Function diagnosing device for image processor for flaw inspection
US4819181A (en) * 1986-04-18 1989-04-04 Tornbloms Kvalitetskontroll Ab Performance increasing signal processing device
JPH05317460A (en) * 1992-05-19 1993-12-03 Setouchi Kigyo Kk Golf ball cleaner
JPH0641755U (en) * 1992-11-16 1994-06-03 有限会社アトラス工業 Cleaning equipment for golf balls

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59108956A (en) * 1982-12-14 1984-06-23 Nippon Steel Corp Output voltage correction for multiprobe eddy current type flaw detector
JPS62121346A (en) * 1985-11-21 1987-06-02 Kobe Steel Ltd Function diagnosing device for image processor for flaw inspection
US4819181A (en) * 1986-04-18 1989-04-04 Tornbloms Kvalitetskontroll Ab Performance increasing signal processing device
JPH05317460A (en) * 1992-05-19 1993-12-03 Setouchi Kigyo Kk Golf ball cleaner
JPH0641755U (en) * 1992-11-16 1994-06-03 有限会社アトラス工業 Cleaning equipment for golf balls

Also Published As

Publication number Publication date
JPS615619B2 (en) 1986-02-20

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