JPS5552156A - Test unit for logic circuit - Google Patents

Test unit for logic circuit

Info

Publication number
JPS5552156A
JPS5552156A JP12357478A JP12357478A JPS5552156A JP S5552156 A JPS5552156 A JP S5552156A JP 12357478 A JP12357478 A JP 12357478A JP 12357478 A JP12357478 A JP 12357478A JP S5552156 A JPS5552156 A JP S5552156A
Authority
JP
Japan
Prior art keywords
result
tested circuits
disagreement
fixtures
decision
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12357478A
Other languages
Japanese (ja)
Other versions
JPS619651B2 (en
Inventor
Osamu Ito
Nobuo Wakatsuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHIYOU LSI GIJUTSU KENKYU KUMIAI
Original Assignee
CHIYOU LSI GIJUTSU KENKYU KUMIAI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHIYOU LSI GIJUTSU KENKYU KUMIAI filed Critical CHIYOU LSI GIJUTSU KENKYU KUMIAI
Priority to JP12357478A priority Critical patent/JPS5552156A/en
Publication of JPS5552156A publication Critical patent/JPS5552156A/en
Publication of JPS619651B2 publication Critical patent/JPS619651B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To increase the reliability at inspection and to reduce the inspection time, by selecting non-defective goods with decision by majority., if disagreement is taken place for the result of the test of tested circuits three or more.
CONSTITUTION: The register 15 performs set and reset of various registers based on the input information from the host machine 2, and feeds the input signal to the fixture interface section 16. Further, this signal is fed to the fixtures 21W23 mounting the tested circuits. Moreover, the result of the response of the output of the fixtures 21W23 is fed to the output detection comparison section 14 to compare the state of all the terminals. As a result, if disagreement is taken place, the decision by majority circuit 17 regards the tested circuits having many agreement as non- defective goods.
COPYRIGHT: (C)1980,JPO&Japio
JP12357478A 1978-10-09 1978-10-09 Test unit for logic circuit Granted JPS5552156A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12357478A JPS5552156A (en) 1978-10-09 1978-10-09 Test unit for logic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12357478A JPS5552156A (en) 1978-10-09 1978-10-09 Test unit for logic circuit

Publications (2)

Publication Number Publication Date
JPS5552156A true JPS5552156A (en) 1980-04-16
JPS619651B2 JPS619651B2 (en) 1986-03-25

Family

ID=14863943

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12357478A Granted JPS5552156A (en) 1978-10-09 1978-10-09 Test unit for logic circuit

Country Status (1)

Country Link
JP (1) JPS5552156A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS599761A (en) * 1982-07-07 1984-01-19 Nec Corp Diagnosing system of data processing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS599761A (en) * 1982-07-07 1984-01-19 Nec Corp Diagnosing system of data processing device

Also Published As

Publication number Publication date
JPS619651B2 (en) 1986-03-25

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