JPS5582006A - Measuring method for thickness - Google Patents
Measuring method for thicknessInfo
- Publication number
- JPS5582006A JPS5582006A JP15530078A JP15530078A JPS5582006A JP S5582006 A JPS5582006 A JP S5582006A JP 15530078 A JP15530078 A JP 15530078A JP 15530078 A JP15530078 A JP 15530078A JP S5582006 A JPS5582006 A JP S5582006A
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- scattered beams
- measured object
- extent
- movement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title abstract 2
- 238000001514 detection method Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Abstract
PURPOSE: To measure the thickness without contacting with the measured object, by measuring the extent of movement detected with the scattered beams through the movement of the detector in the direction of the thickness in which the scattered beams from the measured object are received through the emission of radiant rays from the beam source.
CONSTITUTION: The radiant ray source 2 is located on the measured object 1, and radiant rays A are emitted to the measured object 1 from the opening 4 of the shielded object 3. The radiant ray detector 5 is enclosed with the shield material 6 so that the scattered beams B can be incident from one direction only, the detection of scattered beams is made while moving the detector 5 in parallel with the direction of the thickness to measure the extent of movement P in which the scattered beams can be detected. Since the extent of movement P which can detect the scattered beams B and the thickness x are in geometrical relation according to the Compton effect, the thickness x can directly be known from the extent P. With this thickness measuring method, simple measurement is enabled without contacting the measuring unit on the measured object.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15530078A JPS5582006A (en) | 1978-12-15 | 1978-12-15 | Measuring method for thickness |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15530078A JPS5582006A (en) | 1978-12-15 | 1978-12-15 | Measuring method for thickness |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5582006A true JPS5582006A (en) | 1980-06-20 |
Family
ID=15602873
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15530078A Pending JPS5582006A (en) | 1978-12-15 | 1978-12-15 | Measuring method for thickness |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5582006A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60140105A (en) * | 1983-12-27 | 1985-07-25 | Shimadzu Corp | Multilayer film analyzer |
| JPS60249041A (en) * | 1984-05-24 | 1985-12-09 | Tokyo Gas Co Ltd | Inspecting device of wall of pipe and tank or the like |
| JPH04289412A (en) * | 1991-03-01 | 1992-10-14 | Rigaku Denki Kogyo Kk | Method and apparatus for measuring attached amount of coating |
| CN102854208A (en) * | 2012-09-25 | 2013-01-02 | 中国科学院高能物理研究所 | Ray back scattering imaging system for discriminating depth information |
| JP2015215261A (en) * | 2014-05-12 | 2015-12-03 | 一般財団法人電力中央研究所 | Nondestructive inspection method and apparatus |
| JP2015232557A (en) * | 2014-05-12 | 2015-12-24 | 一般財団法人電力中央研究所 | Nondestructive inspection method and apparatus |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4975364A (en) * | 1972-11-21 | 1974-07-20 |
-
1978
- 1978-12-15 JP JP15530078A patent/JPS5582006A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4975364A (en) * | 1972-11-21 | 1974-07-20 |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60140105A (en) * | 1983-12-27 | 1985-07-25 | Shimadzu Corp | Multilayer film analyzer |
| JPS60249041A (en) * | 1984-05-24 | 1985-12-09 | Tokyo Gas Co Ltd | Inspecting device of wall of pipe and tank or the like |
| JPH04289412A (en) * | 1991-03-01 | 1992-10-14 | Rigaku Denki Kogyo Kk | Method and apparatus for measuring attached amount of coating |
| CN102854208A (en) * | 2012-09-25 | 2013-01-02 | 中国科学院高能物理研究所 | Ray back scattering imaging system for discriminating depth information |
| JP2015215261A (en) * | 2014-05-12 | 2015-12-03 | 一般財団法人電力中央研究所 | Nondestructive inspection method and apparatus |
| JP2015232557A (en) * | 2014-05-12 | 2015-12-24 | 一般財団法人電力中央研究所 | Nondestructive inspection method and apparatus |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| ES480472A1 (en) | Device for determining the spatial absorption distribution in a plane of examination | |
| ES8106404A1 (en) | Process and arrangement for examining a body by means of penetrating rays. | |
| US3936638A (en) | Radiology | |
| DE3279479D1 (en) | Apparatus for measuring thickness | |
| US3412249A (en) | Backscatter thickness measuring gauge utilizing different energy levels of bremsstrahlung and two ionization chambers | |
| JPS5582006A (en) | Measuring method for thickness | |
| JPS5365777A (en) | Surface defect detector | |
| ES476174A2 (en) | Device for examining a body by means of penetrating radiation | |
| JPS5681417A (en) | Inspecting device for shape of columnar body | |
| GB1176209A (en) | A Device for X-Ray Radiometric Determination of the Concentration of Elements in Test Specimes | |
| JPS5342762A (en) | Radiation measuring apparatus | |
| JPS5582007A (en) | Thickness measuring unit for plain bearing material using radiant ray | |
| US3350561A (en) | Moisture content measurement having neutron reflecting material to provide optimum counting range | |
| SE8602406L (en) | SET TO DETERMINE DENSITY FOR UNDERLYING STOCK | |
| JPS5723810A (en) | Measurement for wall thickness of tube material | |
| JPS5213378A (en) | Automatic measuring device for reflexibility distribution | |
| JPS54685A (en) | Simultaneously measurement of florescent x ray and diffracted x ray of minute area | |
| US3452202A (en) | Method for determining the surface density and thickness of sheet materials and films | |
| GB1332581A (en) | Method and arrangement for the determination of the filler content in paper | |
| JPS5594149A (en) | Reflecting type ash content meter | |
| JPS57197410A (en) | Measuring method of adhered amount of high polymer film on metallic plate | |
| SU1146552A1 (en) | Device for measuring material thickness | |
| JPS5767808A (en) | Measuring device for thickness and shape of plate | |
| JPS542104A (en) | Face run-out detector of rotating bodies | |
| SU114534A1 (en) | A method for measuring the difference in thickness or wall thickness of pipes, convex tanks and other similar objects and an apparatus for carrying out the method |