JPS5582967A - Measuring method for electric signal wave-form using optical-fiber - Google Patents
Measuring method for electric signal wave-form using optical-fiberInfo
- Publication number
- JPS5582967A JPS5582967A JP15715278A JP15715278A JPS5582967A JP S5582967 A JPS5582967 A JP S5582967A JP 15715278 A JP15715278 A JP 15715278A JP 15715278 A JP15715278 A JP 15715278A JP S5582967 A JPS5582967 A JP S5582967A
- Authority
- JP
- Japan
- Prior art keywords
- signals
- fiber
- optical
- measured
- electric signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013307 optical fiber Substances 0.000 title abstract 3
Landscapes
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Abstract
PURPOSE: To measure a wave form of the signals of an electric circuit charged to high voltage easily, safely and accurately, by a system wherein signals to be measured are converted into light-signals, and guided to a light receiving element through an optical-fiber, and original electric signals are regenerated.
CONSTITUTION: Electric signals to be measured are applied to a signal input terminal 51, and matched to the input impedance of a luminous element 60 by using an active element of an FET, etc. Fixed currents are beforehand let flow when the input voltage of an impedance matching circuit 50 is zero volt so that even input signals with inverse polarity can be used. The luminous-output of the light emitting element 60 is transmitted by means of an optical-fiber 70, and converted into electric signals by means of a light receiving element 80. The electric signals regenerated are amplified by means of an amplifier 90, applied to an oscilloscope 100 and observed. Thus, a portion charged to high voltage can be measured by employing a normal oscilloscope.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15715278A JPS5582967A (en) | 1978-12-19 | 1978-12-19 | Measuring method for electric signal wave-form using optical-fiber |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15715278A JPS5582967A (en) | 1978-12-19 | 1978-12-19 | Measuring method for electric signal wave-form using optical-fiber |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5582967A true JPS5582967A (en) | 1980-06-23 |
Family
ID=15643306
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15715278A Pending JPS5582967A (en) | 1978-12-19 | 1978-12-19 | Measuring method for electric signal wave-form using optical-fiber |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5582967A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4928067A (en) * | 1988-12-19 | 1990-05-22 | Siemens Transmission Systems, Inc. | Non-intrusive fiber optic electromagnetic field probe apparatus and associated methods |
| WO2009012848A1 (en) * | 2007-07-23 | 2009-01-29 | Hüttinger Elektronik Gmbh + Co. Kg | Method and arrangement for measurement of parameters of a plasma supply device |
-
1978
- 1978-12-19 JP JP15715278A patent/JPS5582967A/en active Pending
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4928067A (en) * | 1988-12-19 | 1990-05-22 | Siemens Transmission Systems, Inc. | Non-intrusive fiber optic electromagnetic field probe apparatus and associated methods |
| WO2009012848A1 (en) * | 2007-07-23 | 2009-01-29 | Hüttinger Elektronik Gmbh + Co. Kg | Method and arrangement for measurement of parameters of a plasma supply device |
| US8129653B2 (en) | 2007-07-23 | 2012-03-06 | Huettinger Elektronik Gmbh + Co. Kg | Plasma supply device |
| US8154897B2 (en) | 2007-07-23 | 2012-04-10 | Huettinger Elektronik Gmbh + Co. Kg | RF power supply |
| US8222885B2 (en) | 2007-07-23 | 2012-07-17 | Huettinger Elektronik Gmbh + Co. Kg | Isolating a control signal source in a high frequency power supply |
| US8357874B2 (en) | 2007-07-23 | 2013-01-22 | Huettinger Elektronik Gmbh + Co. Kg | Radio frequency power supply |
| US8421377B2 (en) | 2007-07-23 | 2013-04-16 | Huettinger Elektronik Gmbh + Co. Kg | Protecting high-frequency amplifers |
| US8436543B2 (en) | 2007-07-23 | 2013-05-07 | Huettinger Elektronik Gmbh + Co. Kg | Plasma supply device |
| US8466622B2 (en) | 2007-07-23 | 2013-06-18 | Huettinger Elektronik Gmbh + Co. Kg | High frequency power supply |
| US8482205B2 (en) | 2007-07-23 | 2013-07-09 | Huettinger Elektronik Gmbh + Co. Kg | Driving switches of a plasma load power supply |
| US8643279B2 (en) | 2007-07-23 | 2014-02-04 | Huettinger Elektronik Gmbh + Co. Kg | Determining high frequency operating parameters in a plasma system |
| US8866400B2 (en) | 2007-07-23 | 2014-10-21 | Trumpf Huettinger Gmbh + Co. Kg | Plasma supply device |
| DE112008000105B4 (en) * | 2007-07-23 | 2015-08-06 | TRUMPF Hüttinger GmbH + Co. KG | Method and arrangement for measuring parameters of a plasma supply device |
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