JPS5583944A - Diagnosis system for logic device - Google Patents

Diagnosis system for logic device

Info

Publication number
JPS5583944A
JPS5583944A JP15639678A JP15639678A JPS5583944A JP S5583944 A JPS5583944 A JP S5583944A JP 15639678 A JP15639678 A JP 15639678A JP 15639678 A JP15639678 A JP 15639678A JP S5583944 A JPS5583944 A JP S5583944A
Authority
JP
Japan
Prior art keywords
diagnosed
gate
logic
modr2
scanned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15639678A
Other languages
Japanese (ja)
Other versions
JPS6032213B2 (en
Inventor
Hiroaki Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP53156396A priority Critical patent/JPS6032213B2/en
Publication of JPS5583944A publication Critical patent/JPS5583944A/en
Publication of JPS6032213B2 publication Critical patent/JPS6032213B2/en
Expired legal-status Critical Current

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  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To shorten the diagnosis time by selecting simultaneously the plural units of the diagnosed parts featuring the same logic structure or the diagnosed logic module via the module designation register for diagnosis. CONSTITUTION:The logic sum is obtained through gate 5 for the data obtained by scanning out the plural number of the diagnosed part and then set to register SODR6. In this case, only the scanned-out data of the diagnosed part selected via module designation register MODR2' is led to AND gate 10. The output of NOT gate 8 is led to gate 10 instead of the scanned-out data given from the diagnosed part which is not selected via MODR2', and the compensation is given so that the logic product may be secured only among the scanned-out data to each other given from the diagnosed part selected. In case the presence is recognized via FLP for the diagnosed part carrying out the scan-out different from the normal value, the diagnosed parts are designated sequentially and individually via MODR2' to have a comparison between the logic product and the normal value. Thus the faulty point is found out.
JP53156396A 1978-12-20 1978-12-20 Logical unit diagnostic method Expired JPS6032213B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53156396A JPS6032213B2 (en) 1978-12-20 1978-12-20 Logical unit diagnostic method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53156396A JPS6032213B2 (en) 1978-12-20 1978-12-20 Logical unit diagnostic method

Publications (2)

Publication Number Publication Date
JPS5583944A true JPS5583944A (en) 1980-06-24
JPS6032213B2 JPS6032213B2 (en) 1985-07-26

Family

ID=15626812

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53156396A Expired JPS6032213B2 (en) 1978-12-20 1978-12-20 Logical unit diagnostic method

Country Status (1)

Country Link
JP (1) JPS6032213B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6479834A (en) * 1987-06-02 1989-03-24 Texas Instruments Inc Logical circuit having individually testable logic module
JPH03127132A (en) * 1989-10-12 1991-05-30 Koufu Nippon Denki Kk Diagnostic device
JPH03228144A (en) * 1990-02-02 1991-10-09 Koufu Nippon Denki Kk Logic circuit diagnostic device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6479834A (en) * 1987-06-02 1989-03-24 Texas Instruments Inc Logical circuit having individually testable logic module
JPH03127132A (en) * 1989-10-12 1991-05-30 Koufu Nippon Denki Kk Diagnostic device
JPH03228144A (en) * 1990-02-02 1991-10-09 Koufu Nippon Denki Kk Logic circuit diagnostic device

Also Published As

Publication number Publication date
JPS6032213B2 (en) 1985-07-26

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