JPS5586060A - Ion detector for mass spectrometer - Google Patents
Ion detector for mass spectrometerInfo
- Publication number
- JPS5586060A JPS5586060A JP16037078A JP16037078A JPS5586060A JP S5586060 A JPS5586060 A JP S5586060A JP 16037078 A JP16037078 A JP 16037078A JP 16037078 A JP16037078 A JP 16037078A JP S5586060 A JPS5586060 A JP S5586060A
- Authority
- JP
- Japan
- Prior art keywords
- ion
- electrodes
- electrode
- ion detection
- detection electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 150000002500 ions Chemical class 0.000 abstract 9
- 238000001514 detection method Methods 0.000 abstract 6
- 239000000758 substrate Substances 0.000 abstract 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
- 239000011248 coating agent Substances 0.000 abstract 1
- 238000000576 coating method Methods 0.000 abstract 1
- 239000011810 insulating material Substances 0.000 abstract 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 abstract 1
- 238000007747 plating Methods 0.000 abstract 1
- 238000001771 vacuum deposition Methods 0.000 abstract 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE: To simplify positioning by forming the various electrodes such as a number of ion detection electrodes, shielding electrodes, and output terminal electrodes and lead wires on a common substrate by way of plating, vacuum deposition, and ion coating.
CONSTITUTION: A number of ion detection electrodes 12 in specified configuration are arranged and formed at the preset position of the common substrate 11 consisting of insulating material such as quartz glass and the output terminal electrode 14 and the shielding electrode 15 are formed through the lead wire 13. The metallic plate 17 with the slit 16 is arranged at the position which is opposed to the ion detection electrode 12. By using such an ion detector, the ion which has each number of masses arrives at the ion detection electrode 12 through the slit 16 on the metallic plate 17. And the metallic plate 17 can prevent a part of ions which differ in the number of masses to be incident on each detection electrode 12 from being incident on another ion detection electrode.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP53160370A JPS5841623B2 (en) | 1978-12-25 | 1978-12-25 | Mass spectrometer ion detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP53160370A JPS5841623B2 (en) | 1978-12-25 | 1978-12-25 | Mass spectrometer ion detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5586060A true JPS5586060A (en) | 1980-06-28 |
| JPS5841623B2 JPS5841623B2 (en) | 1983-09-13 |
Family
ID=15713499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP53160370A Expired JPS5841623B2 (en) | 1978-12-25 | 1978-12-25 | Mass spectrometer ion detector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5841623B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6111261U (en) * | 1984-06-26 | 1986-01-23 | 株式会社島津製作所 | Helium leak detector analysis tube |
| CN102810441A (en) * | 2011-06-01 | 2012-12-05 | 岛津分析技术研发(上海)有限公司 | Preparation method of ion optic device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6345033U (en) * | 1986-09-10 | 1988-03-26 | ||
| MX2019004681A (en) | 2016-10-21 | 2019-10-07 | Altor Bioscience Corp | Multimeric il-15-based molecules. |
-
1978
- 1978-12-25 JP JP53160370A patent/JPS5841623B2/en not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6111261U (en) * | 1984-06-26 | 1986-01-23 | 株式会社島津製作所 | Helium leak detector analysis tube |
| CN102810441A (en) * | 2011-06-01 | 2012-12-05 | 岛津分析技术研发(上海)有限公司 | Preparation method of ion optic device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5841623B2 (en) | 1983-09-13 |
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