JPS5587907A - Device for continuously inspecting surface of object - Google Patents

Device for continuously inspecting surface of object

Info

Publication number
JPS5587907A
JPS5587907A JP15996378A JP15996378A JPS5587907A JP S5587907 A JPS5587907 A JP S5587907A JP 15996378 A JP15996378 A JP 15996378A JP 15996378 A JP15996378 A JP 15996378A JP S5587907 A JPS5587907 A JP S5587907A
Authority
JP
Japan
Prior art keywords
light
mirror
receiver
detected
convex lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15996378A
Other languages
English (en)
Inventor
Hisashi Kudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP15996378A priority Critical patent/JPS5587907A/ja
Priority to US06/104,950 priority patent/US4284357A/en
Publication of JPS5587907A publication Critical patent/JPS5587907A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP15996378A 1978-12-27 1978-12-27 Device for continuously inspecting surface of object Pending JPS5587907A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP15996378A JPS5587907A (en) 1978-12-27 1978-12-27 Device for continuously inspecting surface of object
US06/104,950 US4284357A (en) 1978-12-27 1979-12-18 Device for continuously inspecting a surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15996378A JPS5587907A (en) 1978-12-27 1978-12-27 Device for continuously inspecting surface of object

Publications (1)

Publication Number Publication Date
JPS5587907A true JPS5587907A (en) 1980-07-03

Family

ID=15704988

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15996378A Pending JPS5587907A (en) 1978-12-27 1978-12-27 Device for continuously inspecting surface of object

Country Status (2)

Country Link
US (1) US4284357A (ja)
JP (1) JPS5587907A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4954723A (en) * 1988-06-13 1990-09-04 Fuji Photo Film Co., Ltd. Disk surface inspection method and apparatus therefor

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58162038A (ja) * 1982-03-23 1983-09-26 Canon Inc 面状態検査装置
US4634881A (en) * 1982-11-09 1987-01-06 Supernova Systems, Inc. Apparatus for detecting impurities in translucent bodies
DE3472300D1 (en) * 1983-04-22 1988-07-28 Sick Optik Elektronik Erwin Device for the detection of faults
US6324298B1 (en) * 1998-07-15 2001-11-27 August Technology Corp. Automated wafer defect inspection system and a process of performing such inspection
CN100356137C (zh) * 2004-10-20 2007-12-19 力特光电科技股份有限公司 在线自动测量光学薄板翘曲的方法以及装置
JP2006162288A (ja) * 2004-12-02 2006-06-22 Nippon Sheet Glass Co Ltd ロッドの反り検査方法および検査装置
US9651500B2 (en) 2013-06-24 2017-05-16 Yoshino Gypsum Co., Ltd. Sizing defect detection system and sizing defect detection method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4862443A (ja) * 1972-01-19 1973-08-31
JPS5071995A (ja) * 1973-10-24 1975-06-14

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1963128A (en) * 1932-02-01 1934-06-19 Percival E Foerderer Measuring apparatus
GB784144A (en) * 1954-10-21 1957-10-02 Casella Electronics Ltd Improvements relating to the counting, size ascertainment, density measurement or other examination of objects
US3618063A (en) * 1970-02-11 1971-11-02 Eastman Kodak Co Defect inspection apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4862443A (ja) * 1972-01-19 1973-08-31
JPS5071995A (ja) * 1973-10-24 1975-06-14

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4954723A (en) * 1988-06-13 1990-09-04 Fuji Photo Film Co., Ltd. Disk surface inspection method and apparatus therefor

Also Published As

Publication number Publication date
US4284357A (en) 1981-08-18

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