JPS5587963A - System for testing semiconductor integrated circuit element - Google Patents

System for testing semiconductor integrated circuit element

Info

Publication number
JPS5587963A
JPS5587963A JP16236978A JP16236978A JPS5587963A JP S5587963 A JPS5587963 A JP S5587963A JP 16236978 A JP16236978 A JP 16236978A JP 16236978 A JP16236978 A JP 16236978A JP S5587963 A JPS5587963 A JP S5587963A
Authority
JP
Japan
Prior art keywords
integrated circuit
semiconductor integrated
tested
stored
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16236978A
Other languages
Japanese (ja)
Inventor
Akira Mizuno
Shozo Satake
Ryozo Yoshino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP16236978A priority Critical patent/JPS5587963A/en
Publication of JPS5587963A publication Critical patent/JPS5587963A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To readily and rapidly test a semiconductor integrated circuit element by storing data obtained when the function confirmed element of the same type as the element to be tested and comparing the data obtained when the element to be tested is operated with the stored data.
CONSTITUTION: A function confirmed semiconductor integrated circuit 101 of the same type is actually operated, and the input and output signal groups of the circuit 101 at that time are stored in combination in a memory 105. An element 202 to be tested is operated using the input signal group stored in the memory 105, and a comparator 203 compares the output signal group 214 of the element 202 at this time with the output signal group (expected output data) 218 stored in the memory 105 to thereby judge the normality of the semiconductor integrated circuit element 202 to be tested.
COPYRIGHT: (C)1980,JPO&Japio
JP16236978A 1978-12-27 1978-12-27 System for testing semiconductor integrated circuit element Pending JPS5587963A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16236978A JPS5587963A (en) 1978-12-27 1978-12-27 System for testing semiconductor integrated circuit element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16236978A JPS5587963A (en) 1978-12-27 1978-12-27 System for testing semiconductor integrated circuit element

Publications (1)

Publication Number Publication Date
JPS5587963A true JPS5587963A (en) 1980-07-03

Family

ID=15753252

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16236978A Pending JPS5587963A (en) 1978-12-27 1978-12-27 System for testing semiconductor integrated circuit element

Country Status (1)

Country Link
JP (1) JPS5587963A (en)

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