JPS5596146A - Ultrasoniccwave inspection device - Google Patents
Ultrasoniccwave inspection deviceInfo
- Publication number
- JPS5596146A JPS5596146A JP368979A JP368979A JPS5596146A JP S5596146 A JPS5596146 A JP S5596146A JP 368979 A JP368979 A JP 368979A JP 368979 A JP368979 A JP 368979A JP S5596146 A JPS5596146 A JP S5596146A
- Authority
- JP
- Japan
- Prior art keywords
- ultrasoniccwave
- inspection device
- inspection
- ultrasoniccwave inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Ultra Sonic Daignosis Equipment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP54003689A JPS6053626B2 (en) | 1979-01-16 | 1979-01-16 | Ultrasonic inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP54003689A JPS6053626B2 (en) | 1979-01-16 | 1979-01-16 | Ultrasonic inspection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5596146A true JPS5596146A (en) | 1980-07-22 |
| JPS6053626B2 JPS6053626B2 (en) | 1985-11-26 |
Family
ID=11564360
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP54003689A Expired JPS6053626B2 (en) | 1979-01-16 | 1979-01-16 | Ultrasonic inspection device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6053626B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011107119A (en) * | 2009-11-16 | 2011-06-02 | Samsung Electro-Mechanics Co Ltd | Circuit pattern defect inspection method of substrate |
-
1979
- 1979-01-16 JP JP54003689A patent/JPS6053626B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011107119A (en) * | 2009-11-16 | 2011-06-02 | Samsung Electro-Mechanics Co Ltd | Circuit pattern defect inspection method of substrate |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6053626B2 (en) | 1985-11-26 |
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