JPS5598867A - Protecting device - Google Patents
Protecting deviceInfo
- Publication number
- JPS5598867A JPS5598867A JP590779A JP590779A JPS5598867A JP S5598867 A JPS5598867 A JP S5598867A JP 590779 A JP590779 A JP 590779A JP 590779 A JP590779 A JP 590779A JP S5598867 A JPS5598867 A JP S5598867A
- Authority
- JP
- Japan
- Prior art keywords
- short
- oxide film
- voltage
- gate
- drain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/811—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using FETs as protective elements
Landscapes
- Amplifiers (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To obtain an input protecting device by utilizing the threshold voltage of a short-channel MOSFET for clamping voltage. CONSTITUTION:The interval L between the source 116 and the drain 102 of a MOSFET 119 having a field oxide film 118 as a gate oxide film is set in the range for allowing a short-channel effect. Thus, the thicker the thickness of the gate oxide film is, the more the short-channel effect becomes to lower the threshold voltage. When the interval between the source and the drain is likewise selected suitably, the clamping voltage can be set arbitrarily lower than the gate insulating withstand voltage so as to protect the input gate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP590779A JPS5598867A (en) | 1979-01-19 | 1979-01-19 | Protecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP590779A JPS5598867A (en) | 1979-01-19 | 1979-01-19 | Protecting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5598867A true JPS5598867A (en) | 1980-07-28 |
Family
ID=11623963
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP590779A Pending JPS5598867A (en) | 1979-01-19 | 1979-01-19 | Protecting device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5598867A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57153472A (en) * | 1981-03-17 | 1982-09-22 | Toshiba Corp | Manufacture of semiconductor device |
| JPS57153473A (en) * | 1981-03-17 | 1982-09-22 | Toshiba Corp | Semiconductor device with input and output protective circuit and its manufacturing method |
| JPH02262374A (en) * | 1989-02-16 | 1990-10-25 | Advanced Micro Devices Inc | electrostatic protection system |
| US5019883A (en) * | 1987-01-28 | 1991-05-28 | Mitsubishi Denki Kabushiki Kaisha | Input protective apparatus of semiconductor device |
| US5285095A (en) * | 1991-06-13 | 1994-02-08 | Nec Corporation | Semiconductor integrated circuit with input protective transistor effective against electric surge |
| US5349227A (en) * | 1991-10-25 | 1994-09-20 | Nec Corporation | Semiconductor input protective device against external surge voltage |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53145486A (en) * | 1977-05-24 | 1978-12-18 | Mitsubishi Electric Corp | Protecting circuit using insulated gate field effect type transistors |
-
1979
- 1979-01-19 JP JP590779A patent/JPS5598867A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53145486A (en) * | 1977-05-24 | 1978-12-18 | Mitsubishi Electric Corp | Protecting circuit using insulated gate field effect type transistors |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57153472A (en) * | 1981-03-17 | 1982-09-22 | Toshiba Corp | Manufacture of semiconductor device |
| JPS57153473A (en) * | 1981-03-17 | 1982-09-22 | Toshiba Corp | Semiconductor device with input and output protective circuit and its manufacturing method |
| US5019883A (en) * | 1987-01-28 | 1991-05-28 | Mitsubishi Denki Kabushiki Kaisha | Input protective apparatus of semiconductor device |
| JPH02262374A (en) * | 1989-02-16 | 1990-10-25 | Advanced Micro Devices Inc | electrostatic protection system |
| US5285095A (en) * | 1991-06-13 | 1994-02-08 | Nec Corporation | Semiconductor integrated circuit with input protective transistor effective against electric surge |
| US5349227A (en) * | 1991-10-25 | 1994-09-20 | Nec Corporation | Semiconductor input protective device against external surge voltage |
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