JPS56110940A - Method for developing and rinsing photoresist - Google Patents
Method for developing and rinsing photoresistInfo
- Publication number
- JPS56110940A JPS56110940A JP806780A JP806780A JPS56110940A JP S56110940 A JPS56110940 A JP S56110940A JP 806780 A JP806780 A JP 806780A JP 806780 A JP806780 A JP 806780A JP S56110940 A JPS56110940 A JP S56110940A
- Authority
- JP
- Japan
- Prior art keywords
- developing
- gas
- rinsing
- processed
- nozzles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/3021—Imagewise removal using liquid means from a wafer supported on a rotating chuck
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Abstract
PURPOSE:To remove charge on sprayed particles and charge on the surface to be processed, by blowing ionized gas on the surface to be processed at the same time as developing and rinsing treatment. CONSTITUTION:Nozzle 5 for ionizing a gas is fixed in combination with each nozzle 3, 4 for developing and rinsing, and the ionized gas is blown on the surface to be processed simultaneously in spraying the developing and rinsing fluids from nozzles 3, 4. An inert filtered gas, such as air, N2, or Ar is used for said gas, and ionization is effected by discharge or the like due to application of a given voltage to the tips of nozzles 5.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP806780A JPS56110940A (en) | 1980-01-25 | 1980-01-25 | Method for developing and rinsing photoresist |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP806780A JPS56110940A (en) | 1980-01-25 | 1980-01-25 | Method for developing and rinsing photoresist |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56110940A true JPS56110940A (en) | 1981-09-02 |
Family
ID=11682995
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP806780A Pending JPS56110940A (en) | 1980-01-25 | 1980-01-25 | Method for developing and rinsing photoresist |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56110940A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04211263A (en) * | 1990-02-19 | 1992-08-03 | Hitachi Chem Co Ltd | Development method |
| JPH05173336A (en) * | 1990-11-28 | 1993-07-13 | Canon Inc | Removing method and removing device for resist |
| US5700629A (en) * | 1990-02-19 | 1997-12-23 | Hitachi Chemical Company, Ltd. | Developing process |
| KR100782939B1 (en) * | 2001-12-29 | 2007-12-07 | 엘지.필립스 엘시디 주식회사 | Cleaner and mask defect removal method of exposure mask |
| US7367725B2 (en) * | 2004-04-22 | 2008-05-06 | Innolux Display Corp. | Method for removing developing solution |
| WO2020017376A1 (en) * | 2018-07-18 | 2020-01-23 | 東京エレクトロン株式会社 | Developing device and developing method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4945463B1 (en) * | 1969-01-24 | 1974-12-04 | ||
| JPS5016871B2 (en) * | 1972-03-24 | 1975-06-17 | ||
| JPS54113265A (en) * | 1978-02-23 | 1979-09-04 | Mitsubishi Electric Corp | Resistor developing equipement |
-
1980
- 1980-01-25 JP JP806780A patent/JPS56110940A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4945463B1 (en) * | 1969-01-24 | 1974-12-04 | ||
| JPS5016871B2 (en) * | 1972-03-24 | 1975-06-17 | ||
| JPS54113265A (en) * | 1978-02-23 | 1979-09-04 | Mitsubishi Electric Corp | Resistor developing equipement |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04211263A (en) * | 1990-02-19 | 1992-08-03 | Hitachi Chem Co Ltd | Development method |
| US5700629A (en) * | 1990-02-19 | 1997-12-23 | Hitachi Chemical Company, Ltd. | Developing process |
| JPH05173336A (en) * | 1990-11-28 | 1993-07-13 | Canon Inc | Removing method and removing device for resist |
| KR100782939B1 (en) * | 2001-12-29 | 2007-12-07 | 엘지.필립스 엘시디 주식회사 | Cleaner and mask defect removal method of exposure mask |
| US7367725B2 (en) * | 2004-04-22 | 2008-05-06 | Innolux Display Corp. | Method for removing developing solution |
| WO2020017376A1 (en) * | 2018-07-18 | 2020-01-23 | 東京エレクトロン株式会社 | Developing device and developing method |
| CN112400215A (en) * | 2018-07-18 | 2021-02-23 | 东京毅力科创株式会社 | Developing apparatus and developing method |
| KR20210032419A (en) * | 2018-07-18 | 2021-03-24 | 도쿄엘렉트론가부시키가이샤 | Developing processing device and developing processing method |
| JPWO2020017376A1 (en) * | 2018-07-18 | 2021-08-02 | 東京エレクトロン株式会社 | Development processing equipment and development processing method |
| US11567444B2 (en) | 2018-07-18 | 2023-01-31 | Tokyo Electron Limited | Developing treatment apparatus and developing treatment method |
| CN112400215B (en) * | 2018-07-18 | 2024-03-26 | 东京毅力科创株式会社 | Developing device and developing method |
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