JPS56112720A - Supperssion of thermal denaturation of compound semiconductor - Google Patents
Supperssion of thermal denaturation of compound semiconductorInfo
- Publication number
- JPS56112720A JPS56112720A JP1452680A JP1452680A JPS56112720A JP S56112720 A JPS56112720 A JP S56112720A JP 1452680 A JP1452680 A JP 1452680A JP 1452680 A JP1452680 A JP 1452680A JP S56112720 A JPS56112720 A JP S56112720A
- Authority
- JP
- Japan
- Prior art keywords
- compound semiconductor
- periodic table
- thermal denaturation
- iii
- alkyl
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/90—Thermal treatments, e.g. annealing or sintering
- H10P95/904—Thermal treatments, e.g. annealing or sintering of Group III-V semiconductors
Landscapes
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
PURPOSE:To prevent the thermal denaturation of the III-V group compound semiconductor in the Periodic Table due to the heat treatment thereof by heat treating the semiconductor in an atmosphere containing alkyl compound vapor of the V group elements in the Periodic Table. CONSTITUTION:GaAs to which Si ion is, for example, injected is annealed at 850 deg.C in hydrogen gas containing trimethyl arsine in concentration of 50-1,000ppm for 20min. Thus, predicted activation rate and impurity profile can be obtained without surface deterioration. The effect of suppressing the thermal denaturation can be also obtained when the liquid phase epitaxial growth of the III-V Group compound semiconductor in the Periodic Table is conducted in alkyl compound vapor or when the diffusion to the III-V compound semiconductor in the Periodic Table is conducted in the alkyl atmosphere.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1452680A JPS56112720A (en) | 1980-02-08 | 1980-02-08 | Supperssion of thermal denaturation of compound semiconductor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1452680A JPS56112720A (en) | 1980-02-08 | 1980-02-08 | Supperssion of thermal denaturation of compound semiconductor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56112720A true JPS56112720A (en) | 1981-09-05 |
Family
ID=11863560
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1452680A Pending JPS56112720A (en) | 1980-02-08 | 1980-02-08 | Supperssion of thermal denaturation of compound semiconductor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56112720A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4879259A (en) * | 1987-09-28 | 1989-11-07 | The Board Of Trustees Of The Leland Stanford Junion University | Rapid thermal annealing of gallium arsenide with trimethyl arsenic overpressure |
| US5096856A (en) * | 1988-03-01 | 1992-03-17 | Texas Instruments Incorporated | In-situ doped silicon using tertiary butyl phosphine |
| US5198387A (en) * | 1989-12-01 | 1993-03-30 | Texas Instruments Incorporated | Method and apparatus for in-situ doping of deposited silicon |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5044776A (en) * | 1973-08-24 | 1975-04-22 | ||
| JPS50137396A (en) * | 1974-04-22 | 1975-10-31 |
-
1980
- 1980-02-08 JP JP1452680A patent/JPS56112720A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5044776A (en) * | 1973-08-24 | 1975-04-22 | ||
| JPS50137396A (en) * | 1974-04-22 | 1975-10-31 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4879259A (en) * | 1987-09-28 | 1989-11-07 | The Board Of Trustees Of The Leland Stanford Junion University | Rapid thermal annealing of gallium arsenide with trimethyl arsenic overpressure |
| US5096856A (en) * | 1988-03-01 | 1992-03-17 | Texas Instruments Incorporated | In-situ doped silicon using tertiary butyl phosphine |
| US5198387A (en) * | 1989-12-01 | 1993-03-30 | Texas Instruments Incorporated | Method and apparatus for in-situ doping of deposited silicon |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Kanber et al. | A comparison of rapid thermal annealing and controlled atmosphere annealing of Si‐implanted GaAs | |
| NL275516A (en) | ||
| JPS56112720A (en) | Supperssion of thermal denaturation of compound semiconductor | |
| JPS56138917A (en) | Vapor phase epitaxial growth | |
| GB1477941A (en) | Epitaxial methods of growing layers of gallium phosphide | |
| JPS5742122A (en) | Manufacture of compound semiconductor device | |
| JPS5742123A (en) | Manufacture of compound semiconductor device | |
| JPS56162841A (en) | Forming method for insulating film of compound semiconductor | |
| JPS5643735A (en) | Manufacture of semiconductor device | |
| JPS55151333A (en) | Fabricating method of semiconductor device | |
| Wang et al. | Reduction of carbon contamination in triethylphosphorus OMVPE GaP layers by Pt/Al2O3 catalyst | |
| JPS6454725A (en) | Heat treating method for compound semiconductor substrate | |
| KR950011016B1 (en) | Semiconductor epitaxy growth method using ultra-high vacuum chemical vapor deposition | |
| JPS60227416A (en) | Annealing method of semiconductor substrate | |
| Kisker et al. | THE VAPOR PHASE INTERACTION OF TRIMETHYLALUMINUM WITH GRAPHITE DURING OMVPE | |
| JPS5660013A (en) | Diffusion of gallium | |
| JPS5375862A (en) | Surface stabilization method of semiconductor | |
| JPS5650520A (en) | Processing method of semiconductor substrate | |
| JPS58140400A (en) | Vapor growth method of gallium arsenide | |
| JPH0746687B2 (en) | Annealing method for GaAs substrate | |
| JPS6419715A (en) | Growth method for semiconductor thin-film | |
| JPS5638827A (en) | Manufacture of semiconductor device | |
| JPH0194662A (en) | Manufacture of mis type semiconductor using gallium arsenide | |
| JPS5737825A (en) | Manufacture of compound semiconductor substrate | |
| JPS55140799A (en) | Gallium nitride crystal growing method |