JPS562046A - Forming system for test data of logic circuit - Google Patents

Forming system for test data of logic circuit

Info

Publication number
JPS562046A
JPS562046A JP7711279A JP7711279A JPS562046A JP S562046 A JPS562046 A JP S562046A JP 7711279 A JP7711279 A JP 7711279A JP 7711279 A JP7711279 A JP 7711279A JP S562046 A JPS562046 A JP S562046A
Authority
JP
Japan
Prior art keywords
data
input
eml
test data
logic circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7711279A
Other languages
Japanese (ja)
Other versions
JPS6120898B2 (en
Inventor
Masaki Ogawa
Noboru Oki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP7711279A priority Critical patent/JPS562046A/en
Publication of JPS562046A publication Critical patent/JPS562046A/en
Publication of JPS6120898B2 publication Critical patent/JPS6120898B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To make it possible to form test data easily at a high speed by combining a logic circuit part with a fault simulator by connecting it to a computer system as an emulator.
CONSTITUTION: Emulator EML serves as one I/O channel and data sent from CPU via data bus 12 are stored in data register RG21 and selection RG22. Then, RG22 selects one of submodules SM231WSM23n and each SM has input RG24 and output RG26; and input data equivalent to the input terminal of LSI in RG21 are set in RG24 and its output signal is applied to normal LSI25 as EML to make RG remember variation corresponding to input variation. The contents of RG26 are transferred to RG21 and sent to CPU via bus 12. Performing fault simulation SML, CPU combines fault SML with EML to supplement input data and output data mutually, so that test data can easily be formed.
COPYRIGHT: (C)1981,JPO&Japio
JP7711279A 1979-06-19 1979-06-19 Forming system for test data of logic circuit Granted JPS562046A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7711279A JPS562046A (en) 1979-06-19 1979-06-19 Forming system for test data of logic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7711279A JPS562046A (en) 1979-06-19 1979-06-19 Forming system for test data of logic circuit

Publications (2)

Publication Number Publication Date
JPS562046A true JPS562046A (en) 1981-01-10
JPS6120898B2 JPS6120898B2 (en) 1986-05-24

Family

ID=13624697

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7711279A Granted JPS562046A (en) 1979-06-19 1979-06-19 Forming system for test data of logic circuit

Country Status (1)

Country Link
JP (1) JPS562046A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60149979A (en) * 1983-10-17 1985-08-07 シラス　コンピユ−タ−ズ　リミテツド Test erecting travelling device for digital circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60149979A (en) * 1983-10-17 1985-08-07 シラス　コンピユ−タ−ズ　リミテツド Test erecting travelling device for digital circuit

Also Published As

Publication number Publication date
JPS6120898B2 (en) 1986-05-24

Similar Documents

Publication Publication Date Title
JPS55153054A (en) Logic circuit simulation system
JPS5572261A (en) Logic unit
JPS6488266A (en) Testing system of semiconductor logic circuit
JPS54125378A (en) Input-output unit for sequence controller
JPS5570754A (en) Large scale integrated circuit element
JPS5685127A (en) Digital signal processor
JPS52138849A (en) Logic integrated circuit
JPS54159135A (en) Sequence control circuit
JPS5388547A (en) Processor for faulty simulation
JPS5487189A (en) Test method for lsi
JPS5563767A (en) Package with two stage terminal
JPS55157039A (en) Test system for logic unit
JPS51117845A (en) Electronic computer fault diagnostic equipment
JPH02134919A (en) Manufacturing method of clock distribution circuit
JPS5384437A (en) Control system for test pattern generation
JPS5674750A (en) Microprogram controlling device
JPS55123743A (en) Logic integrated circuit easy to check
JPS5316540A (en) Bus switching unit for electronic computer
JPS5475251A (en) Logic simulation processor
JPS564071A (en) Inspector of electronic circuit
JPS5690271A (en) Testing method for logic device
JPS55129841A (en) Check circuit for input signal number
JPS5562373A (en) Logic circuit test unit
JPS5413237A (en) Interface circuit
JPS54136143A (en) Input/output circuit connection system for computer