JPS5626253A - Testing device for plane magnetic film and testing method using said device - Google Patents

Testing device for plane magnetic film and testing method using said device

Info

Publication number
JPS5626253A
JPS5626253A JP7163880A JP7163880A JPS5626253A JP S5626253 A JPS5626253 A JP S5626253A JP 7163880 A JP7163880 A JP 7163880A JP 7163880 A JP7163880 A JP 7163880A JP S5626253 A JPS5626253 A JP S5626253A
Authority
JP
Japan
Prior art keywords
testing
magnetic film
plane magnetic
testing method
plane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7163880A
Other languages
English (en)
Inventor
Maudeyui Danieru
Sauron Jiyorujiyu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of JPS5626253A publication Critical patent/JPS5626253A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/02—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements
    • G11C19/08—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure
    • G11C19/085—Generating magnetic fields therefor, e.g. uniform magnetic field for magnetic domain stabilisation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories

Landscapes

  • Magnetic Heads (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measuring Magnetic Variables (AREA)
JP7163880A 1979-06-01 1980-05-30 Testing device for plane magnetic film and testing method using said device Pending JPS5626253A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7914126A FR2458130A1 (fr) 1979-06-01 1979-06-01 Machine de test de memoires a bulles

Publications (1)

Publication Number Publication Date
JPS5626253A true JPS5626253A (en) 1981-03-13

Family

ID=9226156

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7163880A Pending JPS5626253A (en) 1979-06-01 1980-05-30 Testing device for plane magnetic film and testing method using said device

Country Status (5)

Country Link
US (1) US4360775A (ja)
EP (1) EP0020263B1 (ja)
JP (1) JPS5626253A (ja)
DE (1) DE3063282D1 (ja)
FR (1) FR2458130A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12327579B2 (en) 2021-10-25 2025-06-10 Samsung Electronics Co., Ltd. Inspection device

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5823106A (ja) * 1981-07-31 1983-02-10 株式会社日立製作所 巻線用電線及びこれを用いたコイル
JPS6045995A (ja) * 1983-08-22 1985-03-12 Hitachi Ltd 磁気バブルメモリモジユ−ルおよびその装置
RU2709440C1 (ru) * 2019-04-08 2019-12-17 Федеральное государственное бюджетное образовательное учреждение высшего образования "Саратовский национальный исследовательский государственный университет имени Н.Г. Чернышевского" Способ неразрушающего контроля распределения намагниченности по толщине ферритовой плёнки
CN115105928B (zh) * 2022-07-05 2023-12-26 南京大学 一种促进co2吸收传质速率的脱碳装置及方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB967070A (en) * 1960-12-30 1964-08-19 Int Computers & Tabulators Ltd Improvements in or relating to testing apparatus for information storage devices
US3254298A (en) * 1963-09-09 1966-05-31 Burroughs Corp Instrument for measurement of thin magnetic film parameters
NL7406964A (nl) * 1974-05-24 1975-11-26 Philips Nv Inrichting voor het inspecteren van magne- tische kristallen.
GB1597117A (en) * 1977-05-21 1981-09-03 Plessey Co Ltd Magnetic domain devices

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12327579B2 (en) 2021-10-25 2025-06-10 Samsung Electronics Co., Ltd. Inspection device

Also Published As

Publication number Publication date
FR2458130B1 (ja) 1984-04-06
FR2458130A1 (fr) 1980-12-26
DE3063282D1 (en) 1983-07-07
US4360775A (en) 1982-11-23
EP0020263A1 (fr) 1980-12-10
EP0020263B1 (fr) 1983-05-18

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