JPS5628742A - Measuring instrument for xxray device for diagnosis - Google Patents

Measuring instrument for xxray device for diagnosis

Info

Publication number
JPS5628742A
JPS5628742A JP10500879A JP10500879A JPS5628742A JP S5628742 A JPS5628742 A JP S5628742A JP 10500879 A JP10500879 A JP 10500879A JP 10500879 A JP10500879 A JP 10500879A JP S5628742 A JPS5628742 A JP S5628742A
Authority
JP
Japan
Prior art keywords
xxray
diagnosis
measuring instrument
instrument
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10500879A
Other languages
Japanese (ja)
Inventor
Hiroshi Sugimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP10500879A priority Critical patent/JPS5628742A/en
Publication of JPS5628742A publication Critical patent/JPS5628742A/en
Pending legal-status Critical Current

Links

Landscapes

  • Apparatus For Radiation Diagnosis (AREA)
JP10500879A 1979-08-20 1979-08-20 Measuring instrument for xxray device for diagnosis Pending JPS5628742A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10500879A JPS5628742A (en) 1979-08-20 1979-08-20 Measuring instrument for xxray device for diagnosis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10500879A JPS5628742A (en) 1979-08-20 1979-08-20 Measuring instrument for xxray device for diagnosis

Publications (1)

Publication Number Publication Date
JPS5628742A true JPS5628742A (en) 1981-03-20

Family

ID=14396038

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10500879A Pending JPS5628742A (en) 1979-08-20 1979-08-20 Measuring instrument for xxray device for diagnosis

Country Status (1)

Country Link
JP (1) JPS5628742A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003232752A (en) * 2002-02-12 2003-08-22 Yamato Scale Co Ltd Sensitivity calibration method of X-ray foreign substance inspection device and foreign substance sample body for sensitivity calibration
JP2004125715A (en) * 2002-10-07 2004-04-22 Yamato Scale Co Ltd Method and apparatus for calibrating sensitivity of x-ray foreign matter inspection instrument
JP2015524331A (en) * 2012-08-08 2015-08-24 コーニンクレッカ フィリップス エヌ ヴェ Chronic obstructive pulmonary disease (COPD) phantom for computed tomography (CT) and method of using the same
JP2020046342A (en) * 2018-09-20 2020-03-26 アンリツインフィビス株式会社 Test piece for x-ray inspection device and manufacturing method therefor
JP2025022148A (en) * 2023-08-02 2025-02-14 アンリツ株式会社 Test piece and external measurement method

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003232752A (en) * 2002-02-12 2003-08-22 Yamato Scale Co Ltd Sensitivity calibration method of X-ray foreign substance inspection device and foreign substance sample body for sensitivity calibration
JP2004125715A (en) * 2002-10-07 2004-04-22 Yamato Scale Co Ltd Method and apparatus for calibrating sensitivity of x-ray foreign matter inspection instrument
JP2015524331A (en) * 2012-08-08 2015-08-24 コーニンクレッカ フィリップス エヌ ヴェ Chronic obstructive pulmonary disease (COPD) phantom for computed tomography (CT) and method of using the same
JP2020046342A (en) * 2018-09-20 2020-03-26 アンリツインフィビス株式会社 Test piece for x-ray inspection device and manufacturing method therefor
JP2025022148A (en) * 2023-08-02 2025-02-14 アンリツ株式会社 Test piece and external measurement method

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