JPS5660366A - Rush current test circuit - Google Patents

Rush current test circuit

Info

Publication number
JPS5660366A
JPS5660366A JP13587479A JP13587479A JPS5660366A JP S5660366 A JPS5660366 A JP S5660366A JP 13587479 A JP13587479 A JP 13587479A JP 13587479 A JP13587479 A JP 13587479A JP S5660366 A JPS5660366 A JP S5660366A
Authority
JP
Japan
Prior art keywords
contact
current
load
extra
power source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13587479A
Other languages
Japanese (ja)
Inventor
Yusaku Matsubara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP13587479A priority Critical patent/JPS5660366A/en
Publication of JPS5660366A publication Critical patent/JPS5660366A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To obtain a desired flow current and make the life of the contact extra- long for the overflow current and make the device small-size, by providing the contact device of an extra-long life between the material to be tested and the load.
CONSTITUTION: The current from power source E is flowed to load R2 through contact S1 of material A to be tested, load R1, and contact device B of an extra- long life. When contact S11 of device B is opened during the positive power source current, the current is supplied to load R2 through contact S12 and diode D, and no arc is generated at contact S11. Next, D becomes nonconductive during the negative power source current; and if S12 is opened at this time, the current of a prescribe waveform flows. After that, contacts S11 and S12 are opened, and no arc is generated, so that contacts S11 and S12 can be made serviceable for a long life.
COPYRIGHT: (C)1981,JPO&Japio
JP13587479A 1979-10-23 1979-10-23 Rush current test circuit Pending JPS5660366A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13587479A JPS5660366A (en) 1979-10-23 1979-10-23 Rush current test circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13587479A JPS5660366A (en) 1979-10-23 1979-10-23 Rush current test circuit

Publications (1)

Publication Number Publication Date
JPS5660366A true JPS5660366A (en) 1981-05-25

Family

ID=15161787

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13587479A Pending JPS5660366A (en) 1979-10-23 1979-10-23 Rush current test circuit

Country Status (1)

Country Link
JP (1) JPS5660366A (en)

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