JPS5664604A - Correction method of and apparatus for optical devices - Google Patents

Correction method of and apparatus for optical devices

Info

Publication number: JPS5664604A
Authority: JP; Japan
Prior art keywords: correction method; optical devices; optical; devices; correction
Prior art date: 1979-10-12
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Pending

Application number

JP14114680A

Other languages

Japanese (ja)

Inventor

Eru Fuaarando Kureaa

Eichi Gureisu Uiriamu

Daburiyuu Maarei Edowaado

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Farrand Industries Inc

Original Assignee

Farrand Industries Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1979-10-12

Filing date

1980-10-11

Publication date

1981-06-01

1980-10-11 Application filed by Farrand Industries Inc filed Critical Farrand Industries Inc

1981-06-01 Publication of JPS5664604A publication Critical patent/JPS5664604A/en

Status Pending legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Instruments For Measurement Of Length By Optical Means (AREA)
Length Measuring Devices By Optical Means (AREA)
Measurement Of Optical Distance (AREA)
Optical Radar Systems And Details Thereof (AREA)

JP14114680A 1979-10-12 1980-10-11 Correction method of and apparatus for optical devices Pending JPS5664604A (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US8421979A	1979-10-12	1979-10-12

Publications (1)

Publication Number	Publication Date
JPS5664604A true JPS5664604A (en)	1981-06-01

Family

ID=22183567

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP14114680A Pending JPS5664604A (en)	1979-10-12	1980-10-11	Correction method of and apparatus for optical devices

Country Status (10)

Country	Link
JP (1)	JPS5664604A (en)
AU (1)	AU6310680A (en)
BR (1)	BR8006560A (en)
DE (1)	DE3037567A1 (en)
FR (1)	FR2467383A1 (en)
GB (1)	GB2060931A (en)
IL (1)	IL61217A0 (en)
IT (1)	IT1130528B (en)
NO (1)	NO803055L (en)
SE (1)	SE8007100L (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS59218903A (en) *	1983-05-27	1984-12-10	Sumitomo Electric Ind Ltd	Optical measuring device
JPS6255501A (en) *	1985-09-04	1987-03-11	Canon Inc	Laser length measuring apparatus
JPS6428502A (en) *	1987-07-23	1989-01-31	Yokogawa Electric Corp	Length measuring device
CN103033338A (en) *	2012-12-12	2013-04-10	中国科学院长春光学精密机械与物理研究所	Flat field calibrating device and flat field calibrating method of vacuum ultraviolet band imaging system

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE3401900A1 (en) *	1984-01-20	1985-08-01	Fa. Carl Zeiss, 7920 Heidenheim	Interferometer for linear or angular measurement
DE8907250U1 (en) *	1989-06-14	1989-08-10	Dr. Johannes Heidenhain Gmbh, 8225 Traunreut	Laser interferometer - refractometer
US5940180A (en) *	1994-10-11	1999-08-17	Giddings & Lewis	Laser interferometer measurement system for use with machine tools
US6791695B2 (en) *	1999-06-16	2004-09-14	Bandag Licensing Corporation	Shearographic imaging machine with archive memory for animation data and air handling system

1980
- 1980-10-04 DE DE19803037567 patent/DE3037567A1/en not_active Withdrawn
- 1980-10-06 IL IL61217A patent/IL61217A0/en unknown
- 1980-10-09 AU AU63106/80A patent/AU6310680A/en not_active Abandoned
- 1980-10-09 IT IT68554/80A patent/IT1130528B/en active
- 1980-10-09 GB GB8032559A patent/GB2060931A/en not_active Withdrawn
- 1980-10-10 BR BR8006560A patent/BR8006560A/en unknown
- 1980-10-10 FR FR8021701A patent/FR2467383A1/en not_active Withdrawn
- 1980-10-10 NO NO803055A patent/NO803055L/en unknown
- 1980-10-10 SE SE8007100A patent/SE8007100L/en not_active Application Discontinuation
- 1980-10-11 JP JP14114680A patent/JPS5664604A/en active Pending

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS59218903A (en) *	1983-05-27	1984-12-10	Sumitomo Electric Ind Ltd	Optical measuring device
JPS6255501A (en) *	1985-09-04	1987-03-11	Canon Inc	Laser length measuring apparatus
JPS6428502A (en) *	1987-07-23	1989-01-31	Yokogawa Electric Corp	Length measuring device
CN103033338A (en) *	2012-12-12	2013-04-10	中国科学院长春光学精密机械与物理研究所	Flat field calibrating device and flat field calibrating method of vacuum ultraviolet band imaging system

Also Published As

Publication number	Publication date
GB2060931A (en)	1981-05-07
FR2467383A1 (en)	1981-04-17
SE8007100L (en)	1981-04-13
IL61217A0 (en)	1980-12-31
NO803055L (en)	1981-04-13
DE3037567A1 (en)	1981-05-07
AU6310680A (en)	1981-04-16
IT8068554A0 (en)	1980-10-09
IT1130528B (en)	1986-06-18
BR8006560A (en)	1981-04-14

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