JPS5677765A - Measurement/selection device of semiconductor device - Google Patents

Measurement/selection device of semiconductor device

Info

Publication number
JPS5677765A
JPS5677765A JP15478379A JP15478379A JPS5677765A JP S5677765 A JPS5677765 A JP S5677765A JP 15478379 A JP15478379 A JP 15478379A JP 15478379 A JP15478379 A JP 15478379A JP S5677765 A JPS5677765 A JP S5677765A
Authority
JP
Japan
Prior art keywords
measurement
nondefective
semiconductor
products
selection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15478379A
Other languages
Japanese (ja)
Inventor
Masaaki Yasunaga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP15478379A priority Critical patent/JPS5677765A/en
Publication of JPS5677765A publication Critical patent/JPS5677765A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Relating To Insulation (AREA)

Abstract

PURPOSE: To prevent the defective product from being mixed into the nondefective products without selecting twice the products through measurement of the electrical properties, by detecting the defective product at the 1st measurement part and then exhausting it immediately and supplying only the nondefective products to the 2nd measurement part.
CONSTITUTION: The semiconductor device 11 drops by its empty weight along the supply chute 12 which is installed obliquely and then supplied to the measurement position A by the individual sending device 13 to receive the measurement and selection at the 1st measurement part 14 only for the quality. The switching shute 15 is provided at the position B under the part 14, and the semiconductor 11, if decided nondefective, is supplied to the 2nd measurement part 19 at the position C. In case the semiconductor is decided defective, it is exhausted to the defective product storing box 21. The semiconductor 11 supplied to the part 19 as a nondefective product undergoes a measurement of the electrical properties. According to the result of this measurement, the rotary chute 22 turns up to the fixed position to store the nondefective product into one of the boxes 23, 23'...n through selection. In such way, the double selection can be avoided, at the same time preventing the defective product from being mixed into the nondefective products.
COPYRIGHT: (C)1981,JPO&Japio
JP15478379A 1979-11-28 1979-11-28 Measurement/selection device of semiconductor device Pending JPS5677765A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15478379A JPS5677765A (en) 1979-11-28 1979-11-28 Measurement/selection device of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15478379A JPS5677765A (en) 1979-11-28 1979-11-28 Measurement/selection device of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5677765A true JPS5677765A (en) 1981-06-26

Family

ID=15591793

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15478379A Pending JPS5677765A (en) 1979-11-28 1979-11-28 Measurement/selection device of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5677765A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60106123A (en) * 1983-11-14 1985-06-11 ローム株式会社 Electronic part handler
US4694964A (en) * 1983-11-07 1987-09-22 Ekkehard Ueberreiter Device for conveying components particularly integrated chips, from an input magazine to an output magazine
US4976356A (en) * 1988-03-31 1990-12-11 Tdk Corporation Method of and apparatus for optically checking the appearances of chip-type components and sorting the chip-type components

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4694964A (en) * 1983-11-07 1987-09-22 Ekkehard Ueberreiter Device for conveying components particularly integrated chips, from an input magazine to an output magazine
JPS60106123A (en) * 1983-11-14 1985-06-11 ローム株式会社 Electronic part handler
US4976356A (en) * 1988-03-31 1990-12-11 Tdk Corporation Method of and apparatus for optically checking the appearances of chip-type components and sorting the chip-type components

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