JPS568566A - General-purpose circuit tester - Google Patents

General-purpose circuit tester

Info

Publication number
JPS568566A
JPS568566A JP8262279A JP8262279A JPS568566A JP S568566 A JPS568566 A JP S568566A JP 8262279 A JP8262279 A JP 8262279A JP 8262279 A JP8262279 A JP 8262279A JP S568566 A JPS568566 A JP S568566A
Authority
JP
Japan
Prior art keywords
circuits
circuit
unit
tested
general
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8262279A
Other languages
Japanese (ja)
Inventor
Kiyobumi Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8262279A priority Critical patent/JPS568566A/en
Publication of JPS568566A publication Critical patent/JPS568566A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE: To realize an automatic and efficient test for various types of circuits, by writing the information based on the specifications of the circuit to be tested into the memory device.
CONSTITUTION: The tester consists of memory device 1, control unit 2, switching circuits 31W3n, display unit 4 and others. And circuit 20 to be tested is connected to each of output terminals of circuits 31W3n to receive the test. The information based on the specifications of the circuit to be tested is stored in device 1, and unit 2 supplies the current to circuits 31W3n according to the information stored in device 1. At the same time, unit 2 receives the report about the potential level of the output terminal from circuits 31W3n, and then compares this report with the information given from device 1 to decide the working state of circuit 20 to then deliver it to unit 4. Thus an automatic and efficient test is possible for various types of circuits.
COPYRIGHT: (C)1981,JPO&Japio
JP8262279A 1979-07-02 1979-07-02 General-purpose circuit tester Pending JPS568566A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8262279A JPS568566A (en) 1979-07-02 1979-07-02 General-purpose circuit tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8262279A JPS568566A (en) 1979-07-02 1979-07-02 General-purpose circuit tester

Publications (1)

Publication Number Publication Date
JPS568566A true JPS568566A (en) 1981-01-28

Family

ID=13779546

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8262279A Pending JPS568566A (en) 1979-07-02 1979-07-02 General-purpose circuit tester

Country Status (1)

Country Link
JP (1) JPS568566A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50131472A (en) * 1974-04-01 1975-10-17

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50131472A (en) * 1974-04-01 1975-10-17

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