JPS568879A - Insulating gate field effect transistor - Google Patents
Insulating gate field effect transistorInfo
- Publication number
- JPS568879A JPS568879A JP8425979A JP8425979A JPS568879A JP S568879 A JPS568879 A JP S568879A JP 8425979 A JP8425979 A JP 8425979A JP 8425979 A JP8425979 A JP 8425979A JP S568879 A JPS568879 A JP S568879A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- channel
- concentration
- dope
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/213—Channel regions of field-effect devices
- H10D62/221—Channel regions of field-effect devices of FETs
- H10D62/235—Channel regions of field-effect devices of FETs of IGFETs
Abstract
PURPOSE:To obtain a double channel dope and short channel MOSFET for high speed and high density IC by using a semiconductor substrate with the impurity concentration of predetermined range wherein the amount of dope of deep channel and the length of channel are established as predetermined. CONSTITUTION:Punch-through will effectively be checked if a shallow channel part is made high concentration for an MOSFET having P-type channel dope layers 26, 27 of two layers, which are deep and shallow respectively. On the other hand, a threshold voltage is determined by the concentration of a P-type substrate 21 and the dope amount of all channels. If the concentration of the substrate is set at about 3X10<14>cm<-3>-1X10<15>cm<-3>, the substrate voltage dependence on the threshold voltage becomes small. If a deep channel dope layer 26 with predetermined concentration is provided around a depth of 0.4mum from the surfaces of a gate insulating film 24 and the substrate, punch-through at the substrate under the layer 26 will be prevented. The dose amount of the shallow layer 27 is automatically determined from the dose amount of the layer 26 as the total amount of the channel dope is decided by determining the threshold voltage and the concentration of the substrate. Thus, a high speed MOSFET will be obtained by this structure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8425979A JPS568879A (en) | 1979-07-03 | 1979-07-03 | Insulating gate field effect transistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8425979A JPS568879A (en) | 1979-07-03 | 1979-07-03 | Insulating gate field effect transistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS568879A true JPS568879A (en) | 1981-01-29 |
Family
ID=13825448
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8425979A Pending JPS568879A (en) | 1979-07-03 | 1979-07-03 | Insulating gate field effect transistor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS568879A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59167062A (en) * | 1983-03-11 | 1984-09-20 | Fujitsu Ltd | Manufacture of semiconductor device |
| JPS6010780A (en) * | 1983-06-30 | 1985-01-19 | Fujitsu Ltd | Manufacture of semiconductor device |
| US5270235A (en) * | 1988-01-06 | 1993-12-14 | Seiko Epson Corporation | Semiconductor device fabrication |
| JP2002227775A (en) * | 2001-01-31 | 2002-08-14 | Yayoi Chemical Industry Co Ltd | Electric pump for glue and automatic wallpaper gluing machine |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51114074A (en) * | 1975-03-31 | 1976-10-07 | Sony Corp | Insulation gate type field effect transistor |
| JPS52135273A (en) * | 1976-05-06 | 1977-11-12 | Mitsubishi Electric Corp | Mos type semiconductor device |
-
1979
- 1979-07-03 JP JP8425979A patent/JPS568879A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51114074A (en) * | 1975-03-31 | 1976-10-07 | Sony Corp | Insulation gate type field effect transistor |
| JPS52135273A (en) * | 1976-05-06 | 1977-11-12 | Mitsubishi Electric Corp | Mos type semiconductor device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59167062A (en) * | 1983-03-11 | 1984-09-20 | Fujitsu Ltd | Manufacture of semiconductor device |
| JPS6010780A (en) * | 1983-06-30 | 1985-01-19 | Fujitsu Ltd | Manufacture of semiconductor device |
| US5270235A (en) * | 1988-01-06 | 1993-12-14 | Seiko Epson Corporation | Semiconductor device fabrication |
| JP2002227775A (en) * | 2001-01-31 | 2002-08-14 | Yayoi Chemical Industry Co Ltd | Electric pump for glue and automatic wallpaper gluing machine |
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