JPS57103062A - Probe test device - Google Patents

Probe test device

Info

Publication number
JPS57103062A
JPS57103062A JP17981480A JP17981480A JPS57103062A JP S57103062 A JPS57103062 A JP S57103062A JP 17981480 A JP17981480 A JP 17981480A JP 17981480 A JP17981480 A JP 17981480A JP S57103062 A JPS57103062 A JP S57103062A
Authority
JP
Japan
Prior art keywords
probe card
wire
shield wire
connector
signal transmission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17981480A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6257222B2 (de
Inventor
Kotaro Ozawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17981480A priority Critical patent/JPS57103062A/ja
Publication of JPS57103062A publication Critical patent/JPS57103062A/ja
Publication of JPS6257222B2 publication Critical patent/JPS6257222B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP17981480A 1980-12-19 1980-12-19 Probe test device Granted JPS57103062A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17981480A JPS57103062A (en) 1980-12-19 1980-12-19 Probe test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17981480A JPS57103062A (en) 1980-12-19 1980-12-19 Probe test device

Publications (2)

Publication Number Publication Date
JPS57103062A true JPS57103062A (en) 1982-06-26
JPS6257222B2 JPS6257222B2 (de) 1987-11-30

Family

ID=16072348

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17981480A Granted JPS57103062A (en) 1980-12-19 1980-12-19 Probe test device

Country Status (1)

Country Link
JP (1) JPS57103062A (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4567432A (en) * 1983-06-09 1986-01-28 Texas Instruments Incorporated Apparatus for testing integrated circuits
JPS63108266A (ja) * 1986-10-27 1988-05-13 Tokyo Electron Ltd プローブ装置
JPH0373446U (de) * 1989-11-21 1991-07-24

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5525422U (de) * 1978-08-04 1980-02-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5525422U (de) * 1978-08-04 1980-02-19

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4567432A (en) * 1983-06-09 1986-01-28 Texas Instruments Incorporated Apparatus for testing integrated circuits
JPS63108266A (ja) * 1986-10-27 1988-05-13 Tokyo Electron Ltd プローブ装置
JPH0373446U (de) * 1989-11-21 1991-07-24

Also Published As

Publication number Publication date
JPS6257222B2 (de) 1987-11-30

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