JPS57103253A - Electron beam device - Google Patents
Electron beam deviceInfo
- Publication number
- JPS57103253A JPS57103253A JP55178503A JP17850380A JPS57103253A JP S57103253 A JPS57103253 A JP S57103253A JP 55178503 A JP55178503 A JP 55178503A JP 17850380 A JP17850380 A JP 17850380A JP S57103253 A JPS57103253 A JP S57103253A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- electron beam
- effect
- signal
- correction signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010894 electron beam technology Methods 0.000 title abstract 5
- 230000000694 effects Effects 0.000 abstract 4
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
Abstract
PURPOSE:To reduce the effect of an external magnetic field by detecting the external magnetic field and deflecting an electron beam so as to eliminate the effect. CONSTITUTION:An electron beam 2 generated from an electron beam source 1 deflects the deflection signal 4 of a deflection signal generator 3 and a magnetic field correction signal 12 which is the output of a magnetic field detector 11 detecting a magnetic field near a mirror cylinder 6 through a deflector 5 by a signal mixed by a mixer 13. The magnetic field detector 11 has one or more magnetic field detector near the mirror cylinder. The magnetic field correction signal 12 adjusts the phase and amplitude in a change of the magnetic field so that the effect of the magnetic field on the location of an electron beam can be minimized. Besides, the mixer adjusts the phase and amplitude of the magnetic field correction signal 12. As a result, the effect of an external magnetic field can be reduced with by means of a simple device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55178503A JPS57103253A (en) | 1980-12-17 | 1980-12-17 | Electron beam device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55178503A JPS57103253A (en) | 1980-12-17 | 1980-12-17 | Electron beam device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57103253A true JPS57103253A (en) | 1982-06-26 |
Family
ID=16049597
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55178503A Pending JPS57103253A (en) | 1980-12-17 | 1980-12-17 | Electron beam device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57103253A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6091541A (en) * | 1983-10-25 | 1985-05-22 | Jeol Ltd | Disturbance magnetic field cancellation unit |
-
1980
- 1980-12-17 JP JP55178503A patent/JPS57103253A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6091541A (en) * | 1983-10-25 | 1985-05-22 | Jeol Ltd | Disturbance magnetic field cancellation unit |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS5788659A (en) | Electron ray device | |
| JPS57103253A (en) | Electron beam device | |
| JPS5536990A (en) | Apparatus for applying electron beam | |
| JPS5322357A (en) | Beam blanking unit | |
| JPS527095A (en) | Laser work device | |
| ES477437A1 (en) | Picture display device comprising a field deflection circuit and a field blanking circuit | |
| JPS5322375A (en) | Beam blanking device | |
| FR2331794A1 (en) | High speed signal analysing device - uses signal to modulate electron or light beam deflected across charge coupled device | |
| JPS52103966A (en) | Deflection unit for charged particle ray exposure device | |
| JPS52137260A (en) | Color cathode ray tube unit | |
| JPS54138467A (en) | Scanning type electron microscope or resembling apparatus | |
| JPS5258355A (en) | X-ray detecting unit for electronic microscope | |
| JPS5732557A (en) | Scan electron microscope | |
| JPS5353975A (en) | Electronic beam exposure device | |
| JPS53148455A (en) | Torsion compensating system of rotary polyhedral mirror type light beam scanner | |
| JPS56134462A (en) | Electron beam system | |
| JPS5411678A (en) | Electron ray unit | |
| JPS5396764A (en) | Generating method and apparatus for electron beam linear scanning signal | |
| JPS6463250A (en) | Electron beam processor | |
| JPS5326192A (en) | Compound analyzer | |
| JPS574663A (en) | Deflecting circuit | |
| KR960009804B1 (en) | Miss-convergence compensation apparatus | |
| JPS5498113A (en) | Vertical deflecting circuit | |
| JPS5691423A (en) | Electron beam exposure device | |
| JPS5414115A (en) | Color picture tube unit |