JPS57146378A - Operator programmable inspector and object checking apparatus - Google Patents

Operator programmable inspector and object checking apparatus

Info

Publication number
JPS57146378A
JPS57146378A JP56182402A JP18240281A JPS57146378A JP S57146378 A JPS57146378 A JP S57146378A JP 56182402 A JP56182402 A JP 56182402A JP 18240281 A JP18240281 A JP 18240281A JP S57146378 A JPS57146378 A JP S57146378A
Authority
JP
Japan
Prior art keywords
inspector
checking apparatus
object checking
operator programmable
programmable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56182402A
Other languages
English (en)
Inventor
Jii Wagunaa Giyarii
Efu Baaritsuji Jiyuni Roorensu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INSUPEKUSHIYON TEKUNOROJII Inc
Original Assignee
INSUPEKUSHIYON TEKUNOROJII Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INSUPEKUSHIYON TEKUNOROJII Inc filed Critical INSUPEKUSHIYON TEKUNOROJII Inc
Publication of JPS57146378A publication Critical patent/JPS57146378A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
    • G06V10/987—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns with the intervention of an operator
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
JP56182402A 1980-11-17 1981-11-16 Operator programmable inspector and object checking apparatus Pending JPS57146378A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US20774880A 1980-11-17 1980-11-17

Publications (1)

Publication Number Publication Date
JPS57146378A true JPS57146378A (en) 1982-09-09

Family

ID=22771840

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56182402A Pending JPS57146378A (en) 1980-11-17 1981-11-16 Operator programmable inspector and object checking apparatus

Country Status (5)

Country Link
JP (1) JPS57146378A (ja)
CA (1) CA1193709A (ja)
DE (1) DE3145832A1 (ja)
IT (1) IT1139710B (ja)
MX (1) MX150612A (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
FR2559581B1 (fr) * 1984-02-10 1986-07-11 Siderurgie Fse Inst Rech Procede et installation de detection de defauts de surface sur une bande en cours de defilement
US4696047A (en) * 1985-02-28 1987-09-22 Texas Instruments Incorporated Apparatus for automatically inspecting electrical connecting pins
DE3612256C2 (de) * 1986-04-11 1998-05-14 Twi Tech Wissenschaftliche Ind Verfahren und Einrichtung zur optoelektronischen Qualitätskontrolle
DE19646678A1 (de) * 1996-11-12 1998-05-14 Heuft Systemtechnik Gmbh Verfahren zum Testen der Zuverlässigkeit eines Prüfgerätes, insbesondere eines Leerflascheninspektors
DE19646694A1 (de) 1996-11-12 1998-05-14 Heuft Systemtechnik Gmbh Verfahren zum Testen der Zuverlässigkeit eines Prüfgerätes, insbesondere eines Leerflascheninspektors
JP2002018680A (ja) 2000-07-10 2002-01-22 Mitsubishi Electric Corp 工作機械

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5399731A (en) * 1977-02-14 1978-08-31 Barry Wehmiller Co Method of and device for electronically analyzing image of article to be illuminated
JPS55908A (en) * 1978-06-14 1980-01-07 Toshiba Corp Picture display unit
JPS55119782A (en) * 1979-03-09 1980-09-13 Daihen Corp Pattern automatic inspection method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4025202A (en) * 1975-08-07 1977-05-24 Ball Brothers Service Corporation Method and apparatus for inspecting the bottoms of hollow glass articles
DE2916159C2 (de) * 1979-04-20 1987-04-23 Hajime Industries, Ltd., Tokio/Tokyo Inspektionseinrichtung

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5399731A (en) * 1977-02-14 1978-08-31 Barry Wehmiller Co Method of and device for electronically analyzing image of article to be illuminated
JPS55908A (en) * 1978-06-14 1980-01-07 Toshiba Corp Picture display unit
JPS55119782A (en) * 1979-03-09 1980-09-13 Daihen Corp Pattern automatic inspection method

Also Published As

Publication number Publication date
IT8125038A0 (it) 1981-11-12
DE3145832A1 (de) 1982-09-23
IT1139710B (it) 1986-09-24
MX150612A (es) 1984-05-30
CA1193709A (en) 1985-09-17

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