JPS57173769A - Testing or treating apparatus for electromechanical and electrical member - Google Patents

Testing or treating apparatus for electromechanical and electrical member

Info

Publication number
JPS57173769A
JPS57173769A JP57046165A JP4616582A JPS57173769A JP S57173769 A JPS57173769 A JP S57173769A JP 57046165 A JP57046165 A JP 57046165A JP 4616582 A JP4616582 A JP 4616582A JP S57173769 A JPS57173769 A JP S57173769A
Authority
JP
Japan
Prior art keywords
electromechanical
testing
treating apparatus
electrical member
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57046165A
Other languages
English (en)
Japanese (ja)
Inventor
Yungu Buiruherumu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BIRUHERUMU YUNGU
Original Assignee
BIRUHERUMU YUNGU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BIRUHERUMU YUNGU filed Critical BIRUHERUMU YUNGU
Publication of JPS57173769A publication Critical patent/JPS57173769A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP57046165A 1981-03-24 1982-03-23 Testing or treating apparatus for electromechanical and electrical member Pending JPS57173769A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19818108547U DE8108547U1 (de) 1981-03-24 1981-03-24 Bearbeitungs- oder pruefvorrichtung fuer elektromechanische, elektronische oder dergl. bauteile oder baugruppen, insbesondere fuer gedruckte, geaetzte oder dergl. schaltungen

Publications (1)

Publication Number Publication Date
JPS57173769A true JPS57173769A (en) 1982-10-26

Family

ID=6725996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57046165A Pending JPS57173769A (en) 1981-03-24 1982-03-23 Testing or treating apparatus for electromechanical and electrical member

Country Status (5)

Country Link
JP (1) JPS57173769A (de)
CH (1) CH633403A5 (de)
DE (1) DE8108547U1 (de)
FR (1) FR2502791A1 (de)
GB (1) GB2098813A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0161678U (de) * 1987-10-15 1989-04-19

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0115135A1 (de) * 1982-12-27 1984-08-08 Genrad, Inc. Elektrische Testhalterung für gedruckte Schaltungen und dergleichen
US4626776A (en) * 1984-06-07 1986-12-02 O. B. Test Group, Inc. Programmable test fixture
EP0233992B1 (de) * 1985-11-01 1991-04-17 Hewlett-Packard Company Halterung für Leiterplattentest
KR100295228B1 (ko) 1998-10-13 2001-07-12 윤종용 통합테스트시스템과그를이용한통합테스트공정수행방법

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0161678U (de) * 1987-10-15 1989-04-19

Also Published As

Publication number Publication date
DE8108547U1 (de) 1981-07-16
FR2502791A1 (fr) 1982-10-01
GB2098813A (en) 1982-11-24
CH633403A5 (de) 1982-11-30

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