JPS57192017A - Epitaxial growing method - Google Patents
Epitaxial growing methodInfo
- Publication number
- JPS57192017A JPS57192017A JP56077440A JP7744081A JPS57192017A JP S57192017 A JPS57192017 A JP S57192017A JP 56077440 A JP56077440 A JP 56077440A JP 7744081 A JP7744081 A JP 7744081A JP S57192017 A JPS57192017 A JP S57192017A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- buried diffusion
- diffusion layer
- type
- epitaxial growing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/29—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
- H10P14/2901—Materials
- H10P14/2902—Materials being Group IVA materials
- H10P14/2905—Silicon, silicon germanium or germanium
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/24—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3404—Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
- H10P14/3411—Silicon, silicon germanium or germanium
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3438—Doping during depositing
- H10P14/3441—Conductivity type
- H10P14/3442—N-type
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3438—Doping during depositing
- H10P14/3441—Conductivity type
- H10P14/3444—P-type
Abstract
PURPOSE:To reduce the extent of a buried diffusion layer by forming a not less than 0.5mum thick layer onto a semiconductor substrate, the surface thereof has the buried diffusion layer, through a decompression epitaxial growing method at 700-900 deg.C and shaping an epitaxial growing layer at said temperature or higher. CONSTITUTION:An n type silicon layer 4 is formed on the silicon base plate 3, piled on the surface of a p type substrate 1 thereof the n<+> type buried diffusion layer 2 is shaped, in not less than 0.5mum thickness through epitaxial growth at the temperature of 700-900 deg.C and the pressure of approximately 10 Torr. Impurity diffusion from the buried diffusion layer 2 and the quantity of an n type impurity evaporated from the surface of the buried diffusion layer 2 are reduced, and the extent in the upward direction and lateral direction of the layer 2 is decreased. An n type silicon layer 4' is shaped onto the layer 4 though normal epitaxial growth.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56077440A JPS57192017A (en) | 1981-05-21 | 1981-05-21 | Epitaxial growing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56077440A JPS57192017A (en) | 1981-05-21 | 1981-05-21 | Epitaxial growing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57192017A true JPS57192017A (en) | 1982-11-26 |
Family
ID=13634079
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56077440A Pending JPS57192017A (en) | 1981-05-21 | 1981-05-21 | Epitaxial growing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57192017A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0196923A (en) * | 1987-10-09 | 1989-04-14 | Sony Corp | Epitaxial growth method |
| WO2001035452A1 (en) * | 1999-11-10 | 2001-05-17 | Shin-Etsu Handotai Co., Ltd. | Production method for silicon epitaxial wafer and silicon epitaxial wafer |
| JP2006210934A (en) * | 2006-02-16 | 2006-08-10 | Shin Etsu Handotai Co Ltd | Manufacturing method of silicon epitaxial wafer |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52110570A (en) * | 1976-03-15 | 1977-09-16 | Hitachi Ltd | Forming method of silicon epitaxial layer |
| JPS5361273A (en) * | 1976-11-12 | 1978-06-01 | Nec Home Electronics Ltd | Production of semiconductor device |
-
1981
- 1981-05-21 JP JP56077440A patent/JPS57192017A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52110570A (en) * | 1976-03-15 | 1977-09-16 | Hitachi Ltd | Forming method of silicon epitaxial layer |
| JPS5361273A (en) * | 1976-11-12 | 1978-06-01 | Nec Home Electronics Ltd | Production of semiconductor device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0196923A (en) * | 1987-10-09 | 1989-04-14 | Sony Corp | Epitaxial growth method |
| WO2001035452A1 (en) * | 1999-11-10 | 2001-05-17 | Shin-Etsu Handotai Co., Ltd. | Production method for silicon epitaxial wafer and silicon epitaxial wafer |
| US6589336B1 (en) | 1999-11-10 | 2003-07-08 | Shin-Etsu Handotai Co., Ltd. | Production method for silicon epitaxial wafer and silicon epitaxial wafer |
| JP2006210934A (en) * | 2006-02-16 | 2006-08-10 | Shin Etsu Handotai Co Ltd | Manufacturing method of silicon epitaxial wafer |
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