JPS57197408A - Measuring method of plate thickness - Google Patents

Measuring method of plate thickness

Info

Publication number
JPS57197408A
JPS57197408A JP56081947A JP8194781A JPS57197408A JP S57197408 A JPS57197408 A JP S57197408A JP 56081947 A JP56081947 A JP 56081947A JP 8194781 A JP8194781 A JP 8194781A JP S57197408 A JPS57197408 A JP S57197408A
Authority
JP
Japan
Prior art keywords
plating
compensation
type
plate
setter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56081947A
Other languages
Japanese (ja)
Inventor
Kazunori Masanobu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56081947A priority Critical patent/JPS57197408A/en
Publication of JPS57197408A publication Critical patent/JPS57197408A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To measure the thickness with high accuracy, by separately compensating the dose of radiant rays of a plate to be measured consisting of a base and a plating layer with the base plate eliminating the plating layer, the type of material of the plating layer and the plating compensation. CONSTITUTION:Radiant rays irradiated from a radiant ray source 1 transmit a plate to be measured 2 consisting of plating layers 32, 33 and a base plate 31 and reach an ionization chamber 3. The output is given to a microcomputer 22 via a preamplifier 4 and an AD converter 21. The microcomputer 22 has data required for the correction of type of material and plating compensation for the base plate 31 and the plating layers 32 and 33 from a plate thickness setter 24, a type of material compensation setter 25, a plating amount setter 26, allowing to made computations such as convertion of transmitted amount data into logarithm, compensation of type of material, calculation of deviation, and plating compensation calculation. The thickness can be computed with high accuracy and output is obtained via a DA converter 23.
JP56081947A 1981-05-29 1981-05-29 Measuring method of plate thickness Pending JPS57197408A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56081947A JPS57197408A (en) 1981-05-29 1981-05-29 Measuring method of plate thickness

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56081947A JPS57197408A (en) 1981-05-29 1981-05-29 Measuring method of plate thickness

Publications (1)

Publication Number Publication Date
JPS57197408A true JPS57197408A (en) 1982-12-03

Family

ID=13760690

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56081947A Pending JPS57197408A (en) 1981-05-29 1981-05-29 Measuring method of plate thickness

Country Status (1)

Country Link
JP (1) JPS57197408A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62194410A (en) * 1986-02-21 1987-08-26 Sumitomo Metal Ind Ltd Measurement of thickness of steel plate
KR100507571B1 (en) * 2000-11-07 2005-08-17 주식회사 포스코 A method for measuring thickness of steel sheet using radiation

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51146851A (en) * 1975-06-11 1976-12-16 Yokogawa Hokushin Electric Corp Coat volume measurement device
JPS53124468A (en) * 1977-02-03 1978-10-30 Sangamo Weston Nonncontact thickness meter and calibration method thereof

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51146851A (en) * 1975-06-11 1976-12-16 Yokogawa Hokushin Electric Corp Coat volume measurement device
JPS53124468A (en) * 1977-02-03 1978-10-30 Sangamo Weston Nonncontact thickness meter and calibration method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62194410A (en) * 1986-02-21 1987-08-26 Sumitomo Metal Ind Ltd Measurement of thickness of steel plate
KR100507571B1 (en) * 2000-11-07 2005-08-17 주식회사 포스코 A method for measuring thickness of steel sheet using radiation

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