JPS57200986A - Disturbance resistance magnetic characteristic testing method of magnetic bubble memory - Google Patents

Disturbance resistance magnetic characteristic testing method of magnetic bubble memory

Info

Publication number
JPS57200986A
JPS57200986A JP8526581A JP8526581A JPS57200986A JP S57200986 A JPS57200986 A JP S57200986A JP 8526581 A JP8526581 A JP 8526581A JP 8526581 A JP8526581 A JP 8526581A JP S57200986 A JPS57200986 A JP S57200986A
Authority
JP
Japan
Prior art keywords
current
disturbance
magnetic field
magnetic
bubble memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8526581A
Other languages
Japanese (ja)
Other versions
JPS6037551B2 (en
Inventor
Kan Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP8526581A priority Critical patent/JPS6037551B2/en
Publication of JPS57200986A publication Critical patent/JPS57200986A/en
Publication of JPS6037551B2 publication Critical patent/JPS6037551B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/02—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements
    • G11C19/08—Digital stores in which the information is moved stepwise, e.g. shift registers using magnetic elements using thin films in plane structure
    • G11C19/085—Generating magnetic fields therefor, e.g. uniform magnetic field for magnetic domain stabilisation

Abstract

PURPOSE:To simplify a testing device, by providing a bias coil in the inside of a magnetic shielding body of a magnetic bubble memory chip, and testing a disturbance resistance magnetic field characteritic by making a disturbance current flow into this bias coil and a driving coil. CONSTITUTION:On the circumference of a magnetic bubble memory chip 5, driving coils 3, 4 for generating a rotation driving magnetic field and permanent magnets 2, 6 for forming a bias magnetic field are placed, and the external magnetic field is shielded by a shielding case 1. Also, in the inside of the shielding case 1, a bias coil 12 is placed, of which a magnetic bubble memory device is constituted. In this state, a current which has superposed a disturbance current on a driving current is made flow to the driving coils 3, 4 also a current which has superposed the disturbance current on a bias current is made to flow to the bias coil 12, an artificial disturbance magnetic field is generated, and a test of a disturbance resistance magnetic field is executed. In this way, an especially large-sized testing device becomes unnecessary, and the device is simplified.
JP8526581A 1981-06-03 1981-06-03 Magnetic bubble memory disturbance magnetic field resistance test method Expired JPS6037551B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8526581A JPS6037551B2 (en) 1981-06-03 1981-06-03 Magnetic bubble memory disturbance magnetic field resistance test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8526581A JPS6037551B2 (en) 1981-06-03 1981-06-03 Magnetic bubble memory disturbance magnetic field resistance test method

Publications (2)

Publication Number Publication Date
JPS57200986A true JPS57200986A (en) 1982-12-09
JPS6037551B2 JPS6037551B2 (en) 1985-08-27

Family

ID=13853740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8526581A Expired JPS6037551B2 (en) 1981-06-03 1981-06-03 Magnetic bubble memory disturbance magnetic field resistance test method

Country Status (1)

Country Link
JP (1) JPS6037551B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178680A (en) * 1983-03-30 1984-10-09 Fujitsu Ltd Testing method of bubble device
JPS59217287A (en) * 1983-05-25 1984-12-07 Fujitsu Ltd Testing method of bubble memory element

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59178680A (en) * 1983-03-30 1984-10-09 Fujitsu Ltd Testing method of bubble device
JPS59217287A (en) * 1983-05-25 1984-12-07 Fujitsu Ltd Testing method of bubble memory element

Also Published As

Publication number Publication date
JPS6037551B2 (en) 1985-08-27

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