JPS5737102B2 - - Google Patents

Info

Publication number
JPS5737102B2
JPS5737102B2 JP14656376A JP14656376A JPS5737102B2 JP S5737102 B2 JPS5737102 B2 JP S5737102B2 JP 14656376 A JP14656376 A JP 14656376A JP 14656376 A JP14656376 A JP 14656376A JP S5737102 B2 JPS5737102 B2 JP S5737102B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP14656376A
Other languages
Japanese (ja)
Other versions
JPS5371893A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14656376A priority Critical patent/JPS5371893A/ja
Publication of JPS5371893A publication Critical patent/JPS5371893A/ja
Publication of JPS5737102B2 publication Critical patent/JPS5737102B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
JP14656376A 1976-12-08 1976-12-08 Auger analytical apparatus of broken face Granted JPS5371893A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14656376A JPS5371893A (en) 1976-12-08 1976-12-08 Auger analytical apparatus of broken face

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14656376A JPS5371893A (en) 1976-12-08 1976-12-08 Auger analytical apparatus of broken face

Publications (2)

Publication Number Publication Date
JPS5371893A JPS5371893A (en) 1978-06-26
JPS5737102B2 true JPS5737102B2 (cs) 1982-08-07

Family

ID=15410496

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14656376A Granted JPS5371893A (en) 1976-12-08 1976-12-08 Auger analytical apparatus of broken face

Country Status (1)

Country Link
JP (1) JPS5371893A (cs)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5459267B2 (ja) * 2011-06-07 2014-04-02 新日鐵住金株式会社 鉄鋼材料粒界破断試料の作製方法

Also Published As

Publication number Publication date
JPS5371893A (en) 1978-06-26

Similar Documents

Publication Publication Date Title
JPS5737102B2 (cs)
JPS52162524U (cs)
JPS5750549Y2 (cs)
JPS5427342Y2 (cs)
JPS562259B2 (cs)
JPS5338751U (cs)
JPS5348886U (cs)
JPS5342221U (cs)
JPS5377807U (cs)
JPS52168311U (cs)
JPS52168287U (cs)
CS180533B1 (cs)
CS178400B1 (cs)
CS178394B1 (cs)
CS178368B1 (cs)
JPS52155547U (cs)
CH601789A5 (cs)
CH612737A5 (cs)
CH595487A5 (cs)
CH597285A5 (cs)
CH598073A5 (cs)
CH598954A5 (cs)
CH600456A5 (cs)
CH614540A5 (cs)
CH614109A5 (cs)