JPS574502A - Detector for thickness of sheetform object - Google Patents
Detector for thickness of sheetform objectInfo
- Publication number
- JPS574502A JPS574502A JP7834380A JP7834380A JPS574502A JP S574502 A JPS574502 A JP S574502A JP 7834380 A JP7834380 A JP 7834380A JP 7834380 A JP7834380 A JP 7834380A JP S574502 A JPS574502 A JP S574502A
- Authority
- JP
- Japan
- Prior art keywords
- light
- reflection
- reflection surface
- reflection plate
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003491 array Methods 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
- 238000011144 upstream manufacturing Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
PURPOSE:To enable high-speed and reliable detection without being affected by humidity or other external condition, by a method wherein a reflection surface, a light source, obliquely irradiating the reflection surface with light, and first and second light-receiving elements, which receive a regular reflection light, are disposed in a line. CONSTITUTION:A reflection plate 20 is placed on the way of a conveyance path for a transfer paper, being an object to be measured, and the upper surface of the reflection plate is set in the conveyance path flush with its reflection surface 21. A light source 20, which obliquely irradiates the reflection surface of the reflection plate 20 with light, is situated at the upstream side of the conveyance direction, based on the reflection plate 20. The reflection surface reflects a radiation light 23 from the light source 22, and a light-receiving part 30 receives a regular reflection light 28 through a lens 29. A large number of light-receiving elements, consisting of, for example, photo diodes arrays, are arranged in a row at the light-receiving part 30 and at the side, positioned facing and opposite to the lens 29, and an output switching circuit, which can individually change over the output of each light-receiving element, is mounted. This permits the high-speed and reliable measurement of a sheet thickness, regardless of the sheet form of the object.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7834380A JPS574502A (en) | 1980-06-12 | 1980-06-12 | Detector for thickness of sheetform object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7834380A JPS574502A (en) | 1980-06-12 | 1980-06-12 | Detector for thickness of sheetform object |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS574502A true JPS574502A (en) | 1982-01-11 |
Family
ID=13659335
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7834380A Pending JPS574502A (en) | 1980-06-12 | 1980-06-12 | Detector for thickness of sheetform object |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS574502A (en) |
-
1980
- 1980-06-12 JP JP7834380A patent/JPS574502A/en active Pending
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