JPS5745943A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS5745943A
JPS5745943A JP55121397A JP12139780A JPS5745943A JP S5745943 A JPS5745943 A JP S5745943A JP 55121397 A JP55121397 A JP 55121397A JP 12139780 A JP12139780 A JP 12139780A JP S5745943 A JPS5745943 A JP S5745943A
Authority
JP
Japan
Prior art keywords
pin
test
circuit
function circuit
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55121397A
Other languages
Japanese (ja)
Inventor
Soichi Kawasaki
Soichi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55121397A priority Critical patent/JPS5745943A/en
Publication of JPS5745943A publication Critical patent/JPS5745943A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To enable the evaluation test for the characteristics of a function circuit by using a pin for signal input and a pin for initial reset provided in a general IC as test without using any pin exclusive for the test. CONSTITUTION:When a signal ''1'' is applied to a pin T1R in synchronism with the energization of a power source, a latch circuit 15 is reset, a decoder 16 selects a normal mode, its output is supplied through a gate 17 to a function circuit 18, which thus originally operates. On the other hand, a timer 11 inputs pulses to a pin I during counting, a binary counter 14 counts the pulses, the counted output is stored in a latch circuit 15 together with the output of an FF12, is decoded by a decoder 16, a signal is delivered from a testing circuit 19, and the function circuit 18 performs the evaluation test for the characteristics of a function block. When a rest signal is applied to the pin T1R at the time of completing the test, the function circuit 18 will return to a normal mode. With this configuration, the pins I and I1R are commonly used for the test, and the evaluation of the characteristics of the function circuit can also be performed.
JP55121397A 1980-09-02 1980-09-02 Semiconductor integrated circuit device Pending JPS5745943A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55121397A JPS5745943A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55121397A JPS5745943A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPS5745943A true JPS5745943A (en) 1982-03-16

Family

ID=14810171

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55121397A Pending JPS5745943A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5745943A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4752729A (en) * 1986-07-01 1988-06-21 Texas Instruments Incorporated Test circuit for VSLI integrated circuits
JPS6438673A (en) * 1987-08-04 1989-02-08 Nippon Electric Ic Microcomput Semiconductor integrated circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4752729A (en) * 1986-07-01 1988-06-21 Texas Instruments Incorporated Test circuit for VSLI integrated circuits
JPS6438673A (en) * 1987-08-04 1989-02-08 Nippon Electric Ic Microcomput Semiconductor integrated circuit

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