JPS5756764A - Malfunction detecting circuit for logic circuit - Google Patents

Malfunction detecting circuit for logic circuit

Info

Publication number
JPS5756764A
JPS5756764A JP55131994A JP13199480A JPS5756764A JP S5756764 A JPS5756764 A JP S5756764A JP 55131994 A JP55131994 A JP 55131994A JP 13199480 A JP13199480 A JP 13199480A JP S5756764 A JPS5756764 A JP S5756764A
Authority
JP
Japan
Prior art keywords
circuit
circuits
detecting
electric power
power source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55131994A
Other languages
Japanese (ja)
Inventor
Masashi Kamio
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP55131994A priority Critical patent/JPS5756764A/en
Publication of JPS5756764A publication Critical patent/JPS5756764A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To necessitate less number of detecting circuits despite the presence of many outputs in logic circuits and make circuit constitution simple by OR-connecting the outputs of parallel connected logic circuits, monitoring the magnitude of electric power source current and detecting the change in the logic circuits. CONSTITUTION:Logic circuits 8, 9 having the same function and making the same operation are connected, and the electric power source currents flowing through the circuits 8, 9 are detected with a detecting circuit 11 connected across a resistance 10. The magnitude of the detected currents is fed to an AND circuit 7. For example, if the transistor (TR) in the circuits 8, 9 malfunctions and when TRs 8a, 9b go on and TRs 8b, 9a go off, an electric power source 12 is connected to Vcc 8a 9b earth E, and this results in that the large source currents flow. This is decided as current large in the circuit 11 and an L level signal is fed to the circuit 7. Then, the circuit 7 no longer emits the output signals of the circuits 8, 9 to an output terminal 2, whereby the malfunction is detected. In spite of an increase in the parallel connected circuits, one piece of the detecting circuit 11 is required.
JP55131994A 1980-09-22 1980-09-22 Malfunction detecting circuit for logic circuit Pending JPS5756764A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55131994A JPS5756764A (en) 1980-09-22 1980-09-22 Malfunction detecting circuit for logic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55131994A JPS5756764A (en) 1980-09-22 1980-09-22 Malfunction detecting circuit for logic circuit

Publications (1)

Publication Number Publication Date
JPS5756764A true JPS5756764A (en) 1982-04-05

Family

ID=15071063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55131994A Pending JPS5756764A (en) 1980-09-22 1980-09-22 Malfunction detecting circuit for logic circuit

Country Status (1)

Country Link
JP (1) JPS5756764A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5889789A (en) * 1995-06-30 1999-03-30 Nec Coporation Fault mode estimating system using abnormal current and V-I characteristics

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5889789A (en) * 1995-06-30 1999-03-30 Nec Coporation Fault mode estimating system using abnormal current and V-I characteristics

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